IEC TS 62607-6-4:20 24由IEC技术委员会113:电工产品和系统的纳米技术编制。这是一个技术规范。 这第二版取消并取代了2016年出版的第一版。本版构成技术修订版。 与上一版相比，此版本包括以下重大技术变更: a)更改了文件标题，以更好地反映其目的和应用: 旧标题:石墨烯-使用谐振腔测量表面电导 新标题:石墨烯基材料-表面电导:非接触式微波谐振腔方法。 b)用新的图1和图2替换了以前的图1，以便更好地为非技术读者说明该方法的基本原理及其实现。IEC 62607的这一部分建立了确定关键控制特性的标准化方法 a)表面电导 对于石墨烯和石墨烯基材料的薄膜 b)非接触微波谐振腔法 非接触式微波谐振腔方法监测微波谐振频率偏移和在样品插入微波腔期间腔的品质因数的变化，作为样品表面积的函数。空腔是一个充气的标准R100矩形波导，工作在一种谐振频率模式下，通常在7.5 GHz[4]。 1）该方法适用于通过在金属衬底上化学气相沉积（CVD）、在碳化硅（SiC）上外延生长、从还原氧化石墨烯（rGO）获得或从石墨机械剥离的石墨烯材料【5】。2)该测量不明确地依赖于纳米碳层的厚度。样品的厚度不需要已知，但假设横向尺寸在样品区域上是均匀的。 笔记？在一些国家，R100标准波导被称为WR-90。

IEC TS 62607-6-4:2024 has been prepared by IEC technical committee 113: Nanotechnology for electrotechnical products and systems. It is a Technical Specification.
This second edition cancels and replaces the first edition published in 2016. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) changed the document title to better reflect its purpose and application:
old title: Graphene – Surface conductance measurement using resonant cavity
new title: Graphene based materials – Surface conductance: non-contact microwave resonant cavity method.
b) replaced former Figure 1 with new Figure 1 and Figure 2, to better illustrate the method’s fundamentals and its implementation for a non-technical reader.
This part of IEC 62607 establishes a standardized method to determine the key control characteristic
a) surface conductance
for films of graphene and graphene-based materials by the
b) non-contact microwave resonant cavity method
The non-contact microwave resonant cavity method monitors the microwave resonant frequency shifts and changes in the cavity’s quality factor during the insertion of the specimen into the microwave cavity, as a function of the specimen surface area. The empty cavity is an air-filled standard R100 rectangular waveguide operated at one of the resonant frequency modes, typically at 7,5 GHz [4].
1) The method is applicable for graphene materials which are synthesized by chemical vapour deposition (CVD) on metal substrates, epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO), or mechanically exfoliated from graphite [5].
2) This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimensions are uniform over the specimen area.
NOTE？In some countries, the R100 standard waveguide is referenced as WR-90.