BS PD IEC/TR 62981:2017是一份技术报告，提供了国际演习的结果 以及比较，重点是了解单个样本的统计性能 在晶粒取向电工钢上进行的薄板试验机（SST）测量。这些实验 旨在规定通过单板试验方法测量的强制性参考值 高渗透性（P级）颗粒取向（g-o）材料的分级 根据今天的爱泼斯坦分类法。除此之外，还有爱泼斯坦试验 为了获得更多最新的统计性能，已经进行了测量 与海温统计特征的比较。进行了一些实验 为了更好地了解SST的系统误差性能，i。 e、 他们是 确定绝缘层质量之间的相关性 SST轭和测量的损耗。交叉引用:IEC 60050-221:1990/AMD3:2007IEC 60050-121:1998IEC 60404-2:1996/AMD1:2008IEC 60404-3:1992/AMD1:2002IEC 60404-3:1992 Cons Ed 2-2IEC 60404-3:1992/AMD2:2009IEC 60404-2:1996 Cons Ed 3-1购买本文件时提供的所有当前修改件均包括在内。

BS PD IEC/TR 62981:2017, which is a Technical Report, provides the results of international exercises and comparisons focusing on achieving the knowledge of the statistical performance of single sheet tester (SST) measurements made on grain-oriented electrical steel. These experiments aim at specifying obligatory reference values, measured by the single sheet test method, for the grading of high permeability (P grades) grain-oriented (g.-o.) materials, independently from the Epstein classification as it is practiced today. Besides this, Epstein test measurements have been made in order to gain more up-to-date statistical performance for comparison with the SST statistical characteristics. A few experiments were carried out aiming at improved knowledge on the systematic error performance of the SST, i.e. they were to determine the correlation between the quality of insulation separating laminations in the SST yokes and the measured loss.Cross References:IEC 60050-221:1990/AMD3:2007IEC 60050-121:1998IEC 60404-2:1996/AMD1:2008IEC 60404-3:1992/AMD1:2002IEC 60404-3:1992 Cons Ed 2-2IEC 60404-3:1992/AMD2:2009IEC 60404-2:1996 Cons Ed 3-1All current amendments available at time of purchase are included with the purchase of this document.