BS IEC 62899-503-1:2020-印刷电子产品-国家数字标准馆

现行 BS IEC 62899-503-1:2020

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Printed electronics-Quality assessment. Test method of displacement current measurement for printed thin-film transistor 印刷电子产品

发布日期： 2020-09-25

IEC 62899的本部分规定了位移电流测量（DCM）的试验方法
用于印刷薄膜晶体管（TFT）或有机薄膜晶体管（OTFT）。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This part of IEC 62899 specifies a test method for displacement current measurement (DCM)
for printed thin-film transistors (TFTs) or organic thin-film transistors (OTFTs).All current amendments available at time of purchase are included with the purchase of this document.

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发布单位或类别：英国-英国标准学会

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现行

IEC 62899-503-1-2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
印刷电子.第503-1部分:质量评定.印刷薄膜晶体管位移电流测量的试验方法

2020-05-27

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BS IEC 62899-502-2-2019

Printed electronics-Quality assessment. Organic light emitting diode (OLED) elements. Combined mechanical and environmental stress test methods for flexible OLED elements
印刷电子产品

2019-08-02

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IEC 62899-502-2-2019

Printed electronics - Part 502-2: Quality assessment - Organic light emitting diode (OLED) elements - Combined mechanical and environmental stress test methods for flexible OLED elements
印刷电子.第502-2部分:质量评定.有机发光二极管（OLED）元件.柔性OLED元件的机械和环境应力组合试验方法

2019-07-24