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现行 EIA/JESD 22-A110B
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Test Methods and Procedures for Solid State Devices - Test Method A110-B, High Accelerated Temperature and Humidity Stress Test (HAST) 固态器件的试验方法和程序.试验方法A110-B 高加速温度和湿度应力试验(HAST)
发布日期: 1999-02-01
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发布单位或类别: 美国-电子工业联合会
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