IEEE Std 1500为包含以下内容的集成电路（IC）开发了一种标准的可测试性设计方法: 嵌入的非能量核心。该方法独立于IC的基本功能或 它的单个嵌入式核心。该方法为此类集成电路的测试创造了必要的要求，同时 允许来自不同来源的核心之间的互操作性。

IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.