1.1 本规程涵盖了使用热释光剂量计（TLD）确定电离辐射辐照材料中吸收剂量的程序。虽然程序的某些元素具有更广泛的应用，但具体关注领域是电子设备的辐射硬度测试。本规程适用于测量能量为12至60 MeV的伽马射线、X射线和电子辐照材料的吸收剂量。在描述程序具体应用的适当章节中涵盖了特定能量限制。 吸收剂量范围约为10 −2. 至10 4. Gy（1至10 6. rad），并且吸收剂量率的范围约为10 −2. 至10 10 Gy/s（1至10 12 拉德/秒）。本规程不包括中子辐照材料的吸收剂量和吸收剂量率测量。（参见实践 E2450 用于混合场中的指导。）此外，这些程序中涉及电子辐照的部分主要用于零件测试。 作为更大规模组件（如电子板或盒子）一部分的设备测试可能需要本实践范围以外的技术。 注1: 电子辐照能量上下限的目的是接近简化剂量测定的极限情况。具体而言，规定的剂量测定方法要求接近以下三个极限条件:( 一 )初级电子的能量损失很小( b )二次电子在剂量计内基本停止，并且( c )初级电子产生的轫致辐射大部分丢失。 1.2 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 1.3 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 4.1 材料中的吸收剂量是一个重要参数，可与暴露于电离辐射的电子元件和设备中产生的辐射效应相关。如果源辐射场（即能谱和粒子注量）的知识可用，则可以计算该参数的合理估计。关于辐射场的足够详细信息通常不可用。然而，在辐射测试设施中使用被动剂量计测量吸收剂量可以提供信息，从中可以推断感兴趣材料中的吸收剂量。 在某些规定的条件下，TLD非常适合进行此类测量。 注2: 有关适用于本规程中讨论的辐射类型、能量和吸收剂量率范围的各种剂量测定方法的全面讨论，请参阅ICRU报告14、17、21和34。

1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 10 −2 to 10 4 Gy (1 to 10 6 rad), and the range of absorbed dose rates is approximately from 10 −2 to 10 10 Gy/s (1 to 10 12 rad/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. (See Practice E2450 for guidance in mixed fields.) Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice. Note 1: The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: ( a ) energy loss of the primary electrons is small, ( b ) secondary electrons are largely stopped within the dosimeter, and ( c ) bremsstrahlung radiation generated by the primary electrons is largely lost. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 Absorbed dose in a material is an important parameter that can be correlated with radiation effects produced in electronic components and devices that are exposed to ionizing radiation. Reasonable estimates of this parameter can be calculated if knowledge of the source radiation field (that is, energy spectrum and particle fluence) is available. Sufficiently detailed information about the radiation field is generally not available. However, measurements of absorbed dose with passive dosimeters in a radiation test facility can provide information from which the absorbed dose in a material of interest can be inferred. Under certain prescribed conditions, TLDs are quite suitable for performing such measurements. Note 2: For comprehensive discussions of various dosimetry methods applicable to the radiation types and energy and absorbed dose-rate range discussed in this practice, see ICRU Reports 14, 17, 21, and 34.