IEC 61788的本部分涵盖了一种测试方法，用于测定短直Ag和/或Ag合金护套的Bi-2212和Bi-2223氧化物超导体的直流临界电流，该超导体具有单片结构，形状为圆形导线或含有单芯或多芯氧化物的扁平或方形带。 该方法适用于临界电流小于500 A且n值大于5的超导体。试验在施加和不施加外部磁场的情况下进行。 对于磁场中的所有试验，磁场垂直于试样的长度。在磁场中对胶带试样进行测试时，磁场平行或垂直于较宽的胶带表面（如果是方形，则为一个表面）。试验期间，将试样浸入液氦浴或液氮浴中。本标准中给出了常规试验和其他特定限制所允许的与本试验方法的偏差。

This part of IEC 61788 covers a test method for the determination of the dc critical current of short and straight Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides. This method is intended for use with superconductors that have critical currents less than 500 A and n-values larger than 5. The test is carried out with and without an applying external magnetic field. For all tests in a magnetic field, the magnetic field is perpendicular to the length of the specimen. In the test of a tape specimen in a magnetic field, the magnetic field is parallel or perpendicular to the wider tape surface (or one surface if square). The test specimen is immersed either in a liquid helium bath or a liquid nitrogen bath during testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard.