1.1 在硅电子器件的辐射硬度测试中，Co-60辐射器光子能谱中的低能成分导致吸收剂量增强效应。这些低能成分可能会导致在确定受试特定装置中的吸收剂量时出错。该方法涵盖了使用专用电离室来确定此类效应相对重要性的优值的程序。它还提供了组装该腔室的设计和说明。 1.2 该方法适用于Co-60辐射场的测量，其中暴露率范围为7 × 10 −6. 至3 × 10 −2. C千克 −1. s −1. （约100转/小时至100转/秒）。有关将此方法应用于曝光率>100 R/s的辐射场的指导，请参阅 附录X1 . 注1: 参见术语 E170 用于定义暴露及其单位。 1.3 以国际单位制表示的数值应视为标准。括号中给出的值仅供参考。 1.4 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 1.5 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 4.1 虽然Co-60原子核仅发射1.17和1.33 MeV的单能γ射线，但源的有限厚度、封装材料和其他不可避免地存在于辐射器中的周围结构可以产生大量的低辐射- 能量γ辐射，主要通过康普顿散射 ( 1. , 2. ) . 3. 在电子设备的辐射硬度测试中，由于吸收剂量增强效应，γ谱的低能光子成分可能会给被测设备带来显著的剂量测量误差，因为剂量计测量的平衡吸收剂量可能与沉积在被测设备中的吸收剂量大不相同 ( 3. , 4. ) . 吸收剂量增强效应是指不同材料之间边界附近的非平衡电子传输引起的与平衡吸收剂量的偏差。 4.2 该方法中描述的电离室技术为估计任何给定辐射器类型和配置的低能光子成分的重要性提供了一种简单的方法。 4.3 当特定辐射器配置中存在明显的低能光谱成分时，应使用特殊的实验技术，以确保剂量测定测量值充分代表受试设备中的吸收剂量。（参见实践 E1249号 .)

1.1 Low energy components in the photon energy spectrum of Co-60 irradiators lead to absorbed dose enhancement effects in the radiation-hardness testing of silicon electronic devices. These low energy components may lead to errors in determining the absorbed dose in a specific device under test. This method covers procedures for the use of a specialized ionization chamber to determine a figure of merit for the relative importance of such effects. It also gives the design and instructions for assembling this chamber. 1.2 This method is applicable to measurements in Co-60 radiation fields where the range of exposure rates is 7 × 10 −6 to 3 × 10 −2 C kg −1 s −1 (approximately 100 R/h to 100 R/s). For guidance in applying this method to radiation fields where the exposure rate is >100 R/s, see Appendix X1 . Note 1: See Terminology E170 for definition of exposure and its units. 1.3 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 Although Co-60 nuclei only emit monoenergetic gamma rays at 1.17 and 1.33 MeV, the finite thickness of sources, and encapsulation materials and other surrounding structures that are inevitably present in irradiators can contribute a substantial amount of low-energy gamma radiation, principally by Compton scattering ( 1 , 2 ) . 3 In radiation-hardness testing of electronic devices this low-energy photon component of the gamma spectrum can introduce significant dosimetry errors for a device under test since the equilibrium absorbed dose as measured by a dosimeter can be quite different from the absorbed dose deposited in the device under test because of absorbed dose enhancement effects ( 3 , 4 ) . Absorbed dose enhancement effects refer to the deviations from equilibrium absorbed dose caused by non-equilibrium electron transport near boundaries between dissimilar materials. 4.2 The ionization chamber technique described in this method provides an easy means for estimating the importance of the low-energy photon component of any given irradiator type and configuration. 4.3 When there is an appreciable low-energy spectral component present in a particular irradiator configuration, special experimental techniques should be used to ensure that dosimetry measurements adequately represent the absorbed dose in the device under test. (See Practice E1249 .)