1.1 本试验方法涵盖了在规定条件下，在商业电源频率下测定固体绝缘材料介电强度的程序。 2. , 3. 1.2 除非另有规定，否则试验应在60 Hz下进行。然而，该试验方法适用于25至800 Hz的任何频率。在800 Hz以上的频率下，电介质加热是一个潜在问题。 1.3 本试验方法拟与提及本试验方法的任何ASTM标准或其他文件一起使用。参考本文件需要指定要使用的特定选项（参见 5.5 ). 1.4 它适用于各种温度下，以及在任何合适的气体或液体周围介质中使用。 1.5 本试验方法不用于测量试验条件下流体材料的介电强度。 1.6 本试验方法不用于确定固有介电强度、直流电压介电强度或电应力下的热失效（见试验方法 D3151 ). 1.7 该测试方法最常用于通过试样厚度（击穿）确定介电击穿电压。 它也适用于测定固体试样与周围气体或液体介质之间界面的介电击穿电压（闪络）。添加说明修改部分 12 ，该测试方法也适用于验证测试。 1.8 该试验方法类似于IEC出版物243-1。该方法中的所有程序均包含在IEC 243-1中。该方法与IEC 243-1之间的差异主要是编辑性的。 1.9 本标准并非旨在解决与其使用相关的所有安全问题（如有）。 本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 第节给出了具体的危险说明 7. . 另请参见 6.4.1 . 1.10 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 5.1 电绝缘材料的介电强度是存在电场的任何应用的重要特性。在许多情况下，材料的介电强度将是其所用设备设计的决定因素。 5.2 本文规定的试验适用于提供确定材料适用于给定应用所需的部分信息；此外，还用于检测由加工变量、老化条件或其他制造或环境情况引起的正常特性的变化或偏差。 该测试方法适用于过程控制、验收或研究测试。 5.3 通过该测试方法获得的结果很少能直接用于确定实际应用中材料的介电行为。在大多数情况下，有必要将这些结果与其他功能测试或其他材料测试或两者的结果进行比较，以评估其对特定材料的重要性。 5.4 第节规定了三种电压应用方法 12 :方法A，简称- 时间测试；方法B，逐步试验；方法C，缓慢上升率试验。方法A是质量控制测试中最常用的测试方法。然而，当对不同材料进行相互比较时，时间较长的试验方法B和C通常会得出较低的试验结果，可能会得出更有意义的结果。如果具有电机驱动电压控制的测试装置可用，则缓慢上升率测试比逐步测试更简单、更可取。从方法B和C获得的结果彼此具有可比性。 5.5 规定使用本试验方法的文件还应规定: 5.5.1 电压施加方法， 5.5.2 电压上升率，如果规定了缓慢上升率方法， 5.5.3 样本选择、制备和调节， 5.5.4 试验期间的周围介质和温度， 5.5.5 电极， 5.5.6 只要可能，电流传感元件的故障标准，以及 5.5.7 与推荐程序的任何预期偏差。 5.6 如果符合下列任何要求: 5.5 如果指定文件中缺少，则应遵循几个变量的建议。 5.7 除非 5.5 如果未充分参考本试验方法进行试验，则不符合本试验方法。如果 5.5 如果在试验过程中没有严格控制，则可能出现以下情况: 15.2 和 15.3 不会获得。 5.8 电流传感元件故障标准（电流设置和响应时间）的变化显著影响测试结果。 5.9 附录X1 包含对介电强度测试重要性的更完整讨论。

1.1 This test method covers procedures for the determination of dielectric strength of solid insulating materials at commercial power frequencies, under specified conditions. 2 , 3 1.2 Unless otherwise specified, the tests shall be made at 60 Hz. However, this test method is suitable for use at any frequency from 25 to 800 Hz. At frequencies above 800 Hz, dielectric heating is a potential problem. 1.3 This test method is intended to be used in conjunction with any ASTM standard or other document that refers to this test method. References to this document need to specify the particular options to be used (see 5.5 ). 1.4 It is suitable for use at various temperatures, and in any suitable gaseous or liquid surrounding medium. 1.5 This test method is not intended for measuring the dielectric strength of materials that are fluid under the conditions of test. 1.6 This test method is not intended for use in determining intrinsic dielectric strength, direct-voltage dielectric strength, or thermal failure under electrical stress (see Test Method D3151 ). 1.7 This test method is most commonly used to determine the dielectric breakdown voltage through the thickness of a test specimen (puncture). It is also suitable for use to determine dielectric breakdown voltage along the interface between a solid specimen and a gaseous or liquid surrounding medium (flashover). With the addition of instructions modifying Section 12 , this test method is also suitable for use for proof testing. 1.8 This test method is similar to IEC Publication 243-1. All procedures in this method are included in IEC 243-1. Differences between this method and IEC 243-1 are largely editorial. 1.9 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Specific hazard statements are given in Section 7 . See also 6.4.1 . 1.10 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 5.1 The dielectric strength of an electrical insulating material is a property of interest for any application where an electrical field will be present. In many cases the dielectric strength of a material will be the determining factor in the design of the apparatus in which it is to be used. 5.2 Tests made as specified herein are suitable for use to provide part of the information needed for determining suitability of a material for a given application; and also, for detecting changes or deviations from normal characteristics resulting from processing variables, aging conditions, or other manufacturing or environmental situations. This test method is useful for process control, acceptance or research testing. 5.3 Results obtained by this test method can seldom be used directly to determine the dielectric behavior of a material in an actual application. In most cases it is necessary that these results be evaluated by comparison with results obtained from other functional tests or from tests on other materials, or both, in order to estimate their significance for a particular material. 5.4 Three methods for voltage application are specified in Section 12 : Method A, Short-Time Test; Method B, Step-by-Step Test; and Method C, Slow Rate-of-Rise Test. Method A is the most commonly-used test for quality-control tests. However, the longer-time tests, Methods B and C, which usually will give lower test results, will potentially give more meaningful results when different materials are being compared with each other. If a test set with motor-driven voltage control is available, the slow rate-of-rise test is simpler and preferable to the step-by-step test. The results obtained from Methods B and C are comparable to each other. 5.5 Documents specifying the use of this test method shall also specify: 5.5.1 Method of voltage application, 5.5.2 Voltage rate-of-rise, if slow rate-of-rise method is specified, 5.5.3 Specimen selection, preparation, and conditioning, 5.5.4 Surrounding medium and temperature during test, 5.5.5 Electrodes, 5.5.6 Wherever possible, the failure criterion of the current-sensing element, and 5.5.7 Any desired deviations from the recommended procedures as given. 5.6 If any of the requirements listed in 5.5 are missing from the specifying document, then the recommendations for the several variables shall be followed. 5.7 Unless the items listed in 5.5 are specified, tests made with such inadequate reference to this test method are not in conformance with this test method. If the items listed in 5.5 are not closely controlled during the test, it is possible that the precisions stated in 15.2 and 15.3 will not be obtained. 5.8 Variations in the failure criteria (current setting and response time) of the current sensing element significantly affect the test results. 5.9 Appendix X1 contains a more complete discussion of the significance of dielectric strength tests.