分立半导体器件（不包括光电器件）应遵循的程序、结构类似器件的可能组条件、质量一致性检查要求和各种筛选步骤。电压和电流的首选值，端子的标识。交叉引用:IEC 60747IEC 60748IEC 60749IEC 47（中央办公室）756IEC 47（中央办公室）810IEC 47（中央办公室）886IEC 47（中央办公室）887IEC 47（中央办公室）888IEC 47（中央办公室）891IEC 47（中央办公室）892IEC 47（中央办公室）955包含以下内容:AMD 7208于1992年10月15日发布，2010年1月修订。修订并替换BS QC 750000:1986

Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.Cross References:IEC 60747IEC 60748IEC 60749IEC 47(Central Office)756IEC 47(Central Office)810IEC 47(Central Office)886IEC 47(Central Office)887IEC 47(Central Office)888IEC 47(Central Office)891IEC 47(Central Office)892IEC 47(Central Office)955Incorporates the following:AMD 7208 published 15 October 1992Amendment, January 2010. Amends and replaces BS QC 750000:1986