现行

SJ 21147.3-2016

军用集成电路电磁发射测量方法 第3部分：辐射发射测量-表面扫描法
Measurement of electromagnetic emissions for military integrated circuits - Part 3:Measurement of radiated emissions - Surface scan method

2016-01-19

现行

SJ 21147.5-2016

军用集成电路电磁发射测量方法 第5部分：传导发射测量-工作台法拉第笼法
Measurement of electromagnetic emissions for military integrated circuits - Part 5:Measurement of conducted emissions - Workbench Faraday Cage method

2016-01-19

现行

SJ 21147.1-2016

军用集成电路电磁发射测量方法 第1部分：通用条件和定义
Measurement of electromagnetic emissions for military integrated circuits - Part 1:General conditions and definitions

2016-01-19

现行

SJ 21147.4-2016

军用集成电路电磁发射测量方法 第4部分：传导发射测量 - 1Ω/150Ω直接耦合法
Measurement of electromagnetic emissions for military integrated circuits - Part 4:Measurement of conducted emissions - 1Ω/150Ω direct coupling method

2016-01-19

现行

BS EN IEC 61967-1-2019

Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions
集成电路 电磁辐射的测量 一般条件和定义

2019-02-21

现行

IEC 61967-8-2023 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

2023-05-03

现行

IEC 61967-8-2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
集成电路.电磁发射的测量.第8部分:辐射发射的测量.IC带状线法

2023-05-03

现行

IEC TS 61967-3-2014

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法

2014-08-25

现行

BS EN IEC 61967-4-2021

Integrated circuits. Measurement of electromagnetic emissions-Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
集成电路 电磁辐射测量

2021-05-06

现行

IEC 61967-1-2018

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路电磁辐射测量第1部分:一般条件和定义

2018-12-12

现行

IEC 61967-1-2018 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
集成电路.电磁辐射的测量.第1部分:一般条件和定义

2018-12-12

现行

BS EN 61967-5-2003

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method
集成电路 电磁辐射测量 150 kHz至1 GHz

2003-06-17

现行

IEC 61967-4-2021 RLV

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射的测量第4部分:传导发射的测量1欧姆/150欧姆直接耦合法

2021-03-16

现行

IEC 61967-6-2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法

2002-06-25

现行

IEC 61967-4-2021

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
集成电路电磁发射测量第4部分:1欧姆/150欧姆直接耦合法测量传导发射

2021-03-16

现行

IEC 61967-6-2002+AMD1-2008 CSV

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路.150kHz至1GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法

2008-06-24

现行

BS EN 61967-2-2005

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of radiated emissions. TEM cell and wideband TEM cell method
集成电路 电磁辐射测量 150 kHz至1 GHz

2006-01-23

现行

DIN IEC/TS 61967-3

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法（IEC/TS 61967-3-2014）

2015-08-01

现行

IEC 61967-6-2002/AMD1-2008

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
修改件1.集成电路.150 kHz至1 GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法

2008-03-12

现行

IEC 61967-2-2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
集成电路 - 电磁辐射测量 150 Khz至1 Ghz - 第2部分:辐射辐射测量 - 温度计和宽带温度计方法

2005-09-29