本文件与SCTE 103 2012相同，但可能已更新的信息性组件除外，如标题页、通知文本、页眉和页脚。本文件未作任何规范性修改。本测试程序的目的是测量F连接器与下降电缆屏蔽（外部导体接触电阻）或电缆中心导体与F81套管（内部导体接触电阻）之间的接触电阻或接触紧密度该方法用于评估不需要的高电阻触点的趋势。根据应用情况，高电阻触点可能会导致能量损失过大、过热，并且在有线通信系统中可能会导致公共路径失真。 然而，在任何情况下，最理想的是接触电阻尽可能接近零。

This document is identical to SCTE 103 2012 except for informative components which may have been updated such as the title page, NOTICE text, headers and footers. No normative changes have been made to this document.The purpose of this test procedure is to measure the contact resistance or intimacy of contact between an F connector and the drop cable shield (outer conductor contact resistance) or the cable center conductor and the F81 barrel (inner conductor contact resistance.) This method is used to evaluate the tendency for unwanted high-resistance contacts. Depending on the application, high resistance contacts may cause excessive energy losses, overheating and possibly, in Cable Telecommunications systems, common path distortions. In any case however, it is most desirable to have contact resistance as close to zero as possible.