现行

EIA 364-25C

Probe Damage Test Procedure for Electrical Connectors
电气连接器的探针损坏测试程序

1998-05-01

现行

EIA 364-25

Probe Damage Test Procedure for Electrical Connectors
电气连接器的探针损坏测试程序

2017-04-01

现行

MIL MS3321A

TEST FIXTURE, PROBE DAMAGE, SOCKET CONTACT, CONNECTOR, ELECTRIC (SUPERSEDING MS3321)
测试夹具、探针损坏、插座触点、连接器、电气（替代MS3321）

1970-06-05

现行

MIL MS3321A Notice 1-Validation

TEST FIXTURE, PROBE DAMAGE, SOCKET CONTACT, CONNECTOR, ELECTRIC (SUPERSEDING MS3321)
测试夹具 探针损坏 插座触点 连接器 电气（取代MS3321）

2001-06-12

现行

MIL MIL-DTL-55302/30B Notice 3-Reinstatement

Connectors, Printed Circuit Subassembly and Accessories: Test Probe Fixture for Resistance to Test Probe Damage (No S/S Document)
连接器、印刷电路组件和附件:测试探针损坏电阻测试探针夹具（无S/S文件）

2017-07-10

现行

BS EN 60512-16-1-2008

Connectors for electronic equipment. Tests and measurements-Mechanical tests on contacts and terminations. Test 16a. Probe damage
电子设备用连接器 测试和测量

2008-08-29

现行

BS EN 2591-6415-2002

Elements of electrical and optical connection. Test methods-Optical elements. Test probe damage
电气和光学连接元件 测试方法

2002-01-10

现行

BS EN 2591-415-2001

Elements of electrical and optical connection. Test methods-Test probe damage (female contacts)
电气和光学连接元件 测试方法

2001-12-14

现行

MIL MIL-DTL-55302/30B

CONNECTORS, PRINTED CIRCUIT SUBASSEMBLY AND ACCESSORIES: TEST PROBE FIXTURE FOR RESISTANCE TO TEST PROBE DAMAGE (SUPERSEDING MIL-C-55302/30A)
连接器、印刷电路组件和附件:耐测试探针损坏的测试探针夹具（取代MIL-C-55302/30A）

2003-12-05

现行

IEC 60512-16-1-2008

Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
电子设备连接器 - 测试和测量 - 第16-1部分:触点和端子的机械测试 - 测试16a:探头损坏

2008-06-11

现行

EIA 364-85

General Test Procedure for Assessing Wear and Mechanical Damage Testing of Contact Finishes for Electrical Connectors
评估电气连接器触点表面磨损和机械损伤试验的通用试验程序

1996-06-01

现行

BS 05/30140239 DC

IEC 60512-16-1. Connectors for electronic equipment. Tests and measurements. Part 16-1. Mechanical tests on contacts and terminations. Test 16a. Probe damage
IEC 60512-16-1 电子设备用连接器 测试和测量 第16-1部分 触点和终端的机械试验 测试16a 探针损伤

2005-10-11

现行

DIN EN 2591-6415

Aerospace series - Elements of electrical and optical connection; Test methods - Part 6415: Optical elements; Test probe damage; German and English version EN 2591-6415:2001
航空航天系列.电气和光学连接件；试验方法.第6415部分:光学元件；测试探针损坏；德语和英语版本EN 2591-6415:2001

2003-05-01

现行

DIN EN 2591-415

Aerospace series - Elements of electrical and optical connections; Test methods - Part 415: Test probe damage (female contacts); German and English version EN 2591-415:2001
航空航天系列.电气和光学连接件；试验方法.第415部分:试验探针损坏（母触点）；德语和英语版本EN 2591-415:2001

2002-10-01

现行

ASTM B826-09(2020)

Standard Test Method for Monitoring Atmospheric Corrosion Tests by Electrical Resistance Probes
用电阻探测器监测大气腐蚀试验的标准试验方法

2020-10-01

现行

ADS TS331

Test for Electrical Connectors – Climatic Tests
电气连接器试验–气候试验

1987-10-01

现行

DIN EN 60512-16-1

Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008
电子设备连接器.试验和测量.第16-1部分:触点和终端的机械试验.试验16a:探针损坏（IEC 60512-16-1-2008）；德语版本EN 60512-16-1:2008

2009-03-01

现行

ADS TS371

Test for Electrical Connectors - Electrical Overload
电连接器试验.电过载

1987-10-01

现行

ADS TS333

Test for Electrical Connectors – Corrosion
电气连接器的测试-腐蚀

1985-08-01

现行

SAE AS13441A

Test Methods for Electrical Connectors
电连接器的试验方法

2004-11-11