本文件规定了接触式探测系统的三坐标测量机性能的验收和定期再验证试验，仅适用于使用以下各项的三坐标测量机:-任何类型的接触式探测系统；以及-球形或半球形触针尖。注:由于无法将探测系统的性能与三坐标测量机的性能隔离开来，即使在测试球体等小工件上，三坐标测量机的探测性能测试也由最大允许误差（MPEs）规定。本文件适用于提供以下任何一项的坐标测量机:a） 单触针探测系统；b） 多针探测系统，固定多针连接到单个探针（如“星”针）；c） 多个探测系统，例如每个探测器都有一个触针；d） 有清晰探测系统的系统；e） 触针和探针更换系统；f） 手动（非驱动）和自动坐标测量机；g） 包括扫描探针在内的装置，能够用于扫描模式。本文件不适用于需要不同测试程序的非接触式探测系统。这个词？三坐标测量机和多针探针组合测量系统的尺寸误差已缩短到？多针大小错误'方便。这适用于类似的情况。如果希望尽可能地隔离探测系统的性能，那么CMM的影响可以最小化，但不能消除。更多信息见附件C。

This document specifies acceptance and periodic reverification tests of CMM performance with contacting probing systems and is only applicable to CMMs using: — any type of contacting probing system; and — spherical or hemispherical stylus tip(s). NOTE CMM probing performance tests are specified by the maximum permissible errors (MPEs), due to the impracticality of isolating the performance of the probing system from that of the CMM, even on a small artefact such as a test sphere. This document applies to CMMs supplied with any of the following: a) single-stylus probing systems; b) multi-stylus probing systems with fixed multiple styli attached to a single probe (e.g. "star" stylus); c) multiple probing systems such as those with a stylus for each of their probes; d) systems with articulating probing systems; e) stylus and probe changing systems; f) manual (non-driven) and automated CMMs; g) installations including a scanning probe, capable of being used in a scanning mode. This document is not applicable to non-contacting probing systems, which require different testing procedures. The term?combined CMM and multi-stylus probing system size error' has been shortened to?multi-stylus size error' for convenience. This applies in similar cases. If it is desirable to isolate the probing system performance as far as is practical, the influence of the CMM can be minimized but not eliminated. See Annex C for more information.