Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
表面化学分析——二次离子质谱法——静态二次离子质谱中相对强度标度的重复性和稳定性
发布日期:
2008-11-05
ISO 23830:2008规定了一种用于确认静态二次离子质谱仪正离子相对强度标度的重复性和稳定性的方法,用于一般分析目的。它只适用于装有电荷中和电子枪的仪器。它不是强度/质量响应函数的校准。该校准可由仪器制造商或其他组织进行。本方法提供的数据证实了相对强度与仪器使用的一致性。对可能影响这种稳定性的一些仪器设置给出了指导。
ISO 23830:2008 specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.