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石英晶体频率标准校准规范 Calibration Specification for Quartz Crystal Frequency Standards
发布日期: 2023-10-12
实施日期: 2024-04-12
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发布单位或类别: 中国-国家计量技术规范
关联关系
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用于频率控制和选择的石英晶体单元;第3部分:标准轮廓和引线连接;与IEC 60122-3:1977相同(截至1991年的状态)
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BS EN 60444-11-2010
Measurement of quartz crystal unit parameters-Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
石英晶体单元参数的测量
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石英晶体单位参数的测量 - 第11部分:使用自动网络分析仪技术和误差校正确定负载共振频率(f1)和有效负载电容(cleff)的标准方法
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现行
KS C IEC 60444-11
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石英晶体单位参数的测量 - 第11部分:使用自动网络分析仪技术和误差校正确定负载共振频率(f1)和有效负载电容(cleff)的标准方法
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KS C IEC 60444-1(2021 Confirm)
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KS C IEC 60444-11(2021 Confirm)
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石英晶体元件参数的测量.第11部分:使用自动网络分析仪技术和误差校正测定负载谐振频率fL和有效负载电容CLEF的标准方法
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GB/T 22319.11-2018
石英晶体元件参数的测量 第11部分:采用自动网络分析技术和误差校正确定负载谐振频率和有效负载电容的标准方法
Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction
2018-03-15
现行
BS 08/30180527 DC
BS EN 60444-11. Measurement of Quartz Crystal Unit Parameters. Part 11. Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
英国标准EN 60444-11 石英晶体单元参数的测量 第11部分 用自动网络分析仪技术和误差校正测定负载谐振频率fL和有效负载电容CLEF的标准方法
2008-07-15
现行
IEC 60444-11-2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
石英晶体元件参数的测量.第11部分:用自动网络分析仪技术和误差校正测定负载谐振频率fL和有效负载电容CLeff的标准方法
2010-10-07
现行
BS 9612 N010-1979
Detail specification for cold welded seal quartz crystal units for oscillator applications. DK enclosure, 6.0 to 25 MHz frequency range. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level
振荡器用冷焊密封石英晶体元件详细规范 DK外壳 频率范围为6.0至25 MHz 基本厚度剪切模式 切割时 适用于宽温度范围(非温度控制)的操作 全面评估水平
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现行
BS 9612 N007-1977
Detail specification for cold welded seal quartz crystal units for oscillator applications. DN, DQ and DP enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level
振荡器用冷焊密封石英晶体元件详细规范 DN、DQ和DP外壳 17至75 MHz频率范围 第三泛音厚度剪切模式 切割时 用于窄温度范围内的操作(温度控制) 全面评估水平
1977-06-15