IEC 62899-203:2024作为IEC 62899-203:2024 RLV提供，其中包含国际标准及其红线版本，显示了与上一版本相比技术内容的所有变化。IEC 62899-203:2024定义了术语并指定用于表征和评估半导体油墨和由半导体油墨制成的半导体层的标准方法。与上一版相比，此版本包括以下重大技术变更: a)添加6.3.1.2.2-TFT器件的归一化导通电流测量； b)6.3.2中介电常数计算公式的修正。

IEC 62899-203:2024 is available as IEC 62899-203:2024 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 62899-203:2024 defines terms and specifies standard methods for characterization and evaluation of semiconductor inks and semiconductive layers that are made from semiconductor inks. This edition includes the following significant technical changes with respect to the previous edition:
a) addition of 6.3.1.2.2 - Normalised on-current measurement of the TFT device;
b) in 6.3.2, correction of formula for calculation of permittivity.