Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method (IEC 62132-3:2007); German version EN 62132-3:2007
集成电路.150kHz至1GHz电磁抗扰度的测量.第3部分:大电流注入（BCI）法（IEC 62132-3-2007）；德文版EN 62132-3:2007

2008-04-01

BS EN 62132-1. Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions
英国标准EN 62132-1 集成电路 电磁抗扰度的测量 一般条件和定义

2012-07-11

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012
集成电路.电磁抗扰度的测量.第8部分:辐射抗扰度的测量.集成电路带状线法（IEC 62132-8-2012）；德文版EN 62132-8:2012

2013-03-01

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method (IEC 62132-5:2005); German version EN 62132-5:2006
集成电路.150kHz至1GHz电磁抗扰度的测量.第5部分:工作台法拉第笼法（IEC 62132-5-2005）；德文版EN 62132-5:2006

2006-05-01

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法（IEC/TS 62132-9-2014）

2015-08-01

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method (IEC 62132-4:2006); German version EN 62132-4:2006
集成电路.150 kHz至1 GHz电磁抗扰度的测量.第4部分:直接射频功率注入法（IEC 62132-4-2006）；德文版EN 62132-4:2006

2006-10-01

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
集成电路.电磁抗扰度测量.第2部分:辐射抗扰度测量.TEM室和宽带TEM室法（IEC 62132-2-2010）；德文版EN 62132-2:2011

2011-07-01

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
集成电路.电磁发射的测量.第3部分:辐射发射的测量.表面扫描法（IEC/TS 61967-3-2014）

2015-08-01

BS IEC 62132-2. Integrated Circuits, Measurement of Electro magnetic Immunity, 150 kHz to 1 GHz. Part 2. Measurement of Radiated Immunity Tem-Cell and Wideband Tem-Cell Method
BS IEC 62132-2 集成电路 电磁抗扰度的测量 150kHz至1GHz 第二部分 辐射抗扰度的测量Tem室法和宽带Tem室法

2006-06-09

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 61967-1:2018); German version EN IEC 61967-1:2019
集成电路.电磁辐射的测量.第1部分:一般条件和定义（IEC 61967-1-2018）；德国版本EN IEC 61967-1:2019

2019-09-01

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4
集成电路.150kHz至1GHz电磁发射的测量.第4-1部分:传导发射的测量.1&Omega/150&ω；直接耦合法.IEC 61967-4的应用指南

2005-02-07

Draft Document - Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)
文件草稿.集成电路.150 kHz至1 GHz电磁抗扰度的测量.第2部分:辐射抗扰度的测量.Tem室和宽带Tem室法（IEC 47A/748/CD:2006）

2006-08-01

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003
集成电路.150kHz至1GHz电磁发射的测量.第5部分:传导发射的测量；工作台法拉第笼法（IEC 61967-5-2003）；德文版EN 61967-5:2003

2003-10-01

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (IEC 61967-2:2005); German version EN 61967-2:2005
集成电路.150 kHz至1 GHz电磁发射的测量.第2部分:辐射发射的测量.TEM室和宽带TEM室法（IEC 61967-2-2005）；德文版EN 61967-2:2005

2006-03-01

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008
集成电路.150kHz至1GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法（IEC 61967-6-2002+A1-2008）；德文版EN 61967-6:2002+A1:2008

2008-10-01