BS EN IEC 61967-1:2019提供了有关测量的一般信息和定义 来自集成电路的传导和辐射电磁干扰。它还提供 测量条件、测试设备和设置以及测试的说明 测试报告的程序和内容。交叉引用:IEC 61967-4EN 55016-1-1IEC 61967-5IEC 61967-2IEC 61967-6CISPR 16-1-1IEC TS 61967-3IEC 62132-1IEC 61967-8EN 62132-1EN 61967-2EN 61967-5IEC 61967-8IEC 61967- 2IEC 62132-1EN 61967-8EN 61967-4EN 61967-6IEC 61967-4IEC 61967-5IEC 61967-6CISPR 25:2008EN 55025:2008IEC 60050-161:1990购买本文件时可获得的所有现行修订均包含在购买本文件中。

BS EN IEC 61967-1:2019 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports.Cross References:IEC 61967-4EN 55016-1-1IEC 61967-5IEC 61967-2IEC 61967-6CISPR 16-1-1IEC TS 61967-3IEC 62132-1IEC 61967-8EN 62132-1EN 61967-2EN 61967-5IEC 61967-8IEC 61967-2IEC 62132-1EN 61967-8EN 61967-4EN 61967-6IEC 61967-4IEC 61967-5IEC 61967-6CISPR 25:2008EN 55025:2008IEC 60050-161:1990All current amendments available at time of purchase are included with the purchase of this document.