IEC TS 62916:2017（E）描述了一种分立元件旁路二极管静电放电（ESD）抗扰度试验和数据分析方法。所述试验方法对旁路二极管进行渐进式ESD应力试验，分析方法提供了使用双参数威布尔分布函数分析和推断产生故障的方法。本文件的目的是建立一种通用且可重复的测试方法，用于确定光伏组件制造、包装、运输或安装过程中与ESD事件一致的二极管浪涌电压公差。

IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.