IEC 62496-2-4:2013规定了使用灯光直接照明来决定光学电路板是否合格的试验方法。直接照亮输入端口，并使用区域图像传感器监测光学电路板输出端口的光强度。多余光损耗是根据待测样品和对照样品的总检测光强度计算得出的。该方法用于均匀照亮面积大于核心区域的光电路板（OCB）的输入端口，使用区域图像传感器从OCB的相应输出端口获得区域图像的辐射度，并使用获得的辐射度与对照样品的辐射度进行比较，评估通过还是失败。 这种测试方法的优点是，发射光纤和OCB之间的对准程序是不必要的。 关键词:确定光学电路板、OCB、区域图像传感器是否合格的测试方法

IEC 62496-2-4:2013 specifies the test method to decide whether to pass or fail an optical circuit board using direct illumination by a light. The input ports are directly illuminated and the optical intensity from the output ports of the optical circuit board is monitored using an area image sensor. Excess optical losses are the calculated from total detected intensities of light from a sample to be measured and from a control sample. This method is used to illuminate uniformly the input port of the optical circuit board (OCB) with a larger area than the core area, obtain the radiance of an area image from the corresponding output port of the OCB using an area image sensor, and evaluate whether to pass or fail using the radiance obtained compared to that of a control sample. The advantage of this test method is that the alignment procedure between a launch fibre and the OCB is not necessary. Key words: test method to decide whether to pass or fail an optical circuit board, OCB, area image sensor