现行

BS ISO 19830-2015

Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 电子光谱 X射线光电子能谱峰拟合的最低报告要求

2015-11-30

现行

ISO 19830-2015

Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 - 电子光谱 - X射线光电子能谱峰值拟合的最低报告要求

2015-11-05

现行

GB/T 41073-2021

表面化学分析 电子能谱 X射线光电子能谱峰拟合报告的基本要求
Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

2021-12-31

现行

BS ISO 19668-2017

Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
表面化学分析 X射线光电子能谱 评估和报告均质材料中元素的检测限

2017-09-18

现行

ISO 19668-2017

Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
表面化学分析.X射线光电子能谱.均匀材料中元素的估计和报告检测限

2017-08-14

现行

ISO/TR 18392-2005

Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
表面化学分析——X射线光电子能谱；确定背景的程序

2005-11-17

现行

GB/Z 32490-2016

表面化学分析 X射线光电子能谱 确定本底的程序
Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds

2016-02-24

现行

GB/T 39527-2020

实体面材产品中钙、铝、硅元素含量的测定 化学分析法
Determination of calcium, aluminium and silicon in the solid surface materials—Method of chemical analysis

2020-12-14

现行

BS ISO 11775-2015

Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
表面化学分析 扫描探针显微镜 悬臂梁法向弹簧常数的测定

2015-10-31

现行

ISO 11775-2015

Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
表面化学分析 - 扫描探针显微镜 - 悬臂弹簧常数的测定

2015-10-15

现行

GB/T 42543-2023

表面化学分析 扫描探针显微术 悬臂梁法向弹性常数的测定
Surface chemical analysis—Scanning probe microscopy—Determination of cantilever normal spring constants

2023-05-23

现行

BS PD ISO/TR 19319-2013

Surface chemical analysis. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
表面化学分析 基于波束的方法中确定横向分辨率和锐度的基本方法

2013-03-31

现行

ISO/TR 19319-2013

Surface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
表面化学分析——基于波束的方法中确定横向分辨率和锐度的基本方法

2013-03-06

现行

BS ISO 14706-2014

Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 全反射X射线荧光光谱法测定硅片表面元素污染

2014-07-31

现行

JIS K 0148-2005

Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析用全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染

2005-01-01

现行

GB/T 40110-2021

表面化学分析 全反射X射线荧光光谱法（TXRF）测定硅片表面元素污染
Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

2021-05-21

现行

ISO 14706-2014

Surface chemical analysis — Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
表面化学分析 - 通过全反射X射线荧光（TXRF）光谱测定硅晶片上的表面元素污染

2014-07-25

现行

DIN 32645

Chemical analysis - Decision limit, detection limit and determination limit under repeatability conditions - Terms, methods, evaluation
化学分析.重复性条件下的判定极限 检测极限和测定极限.术语 方法 评估

2008-11-01

现行

DIN 52240-4

Testing of raw materials for the production of glass; chemical analysis of limestone with a minimum content of 95% calcium carbonate; determination of aluminium oxide
玻璃生产原材料的测试；石灰石的化学分析 最低碳酸钙含量为95%；氧化铝的测定

1994-04-01

现行

BS ISO 18516-2006

Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution
表面化学分析 俄歇电子能谱和X射线光电子能谱 横向分辨率的测定

2006-11-30