1.1 本试验方法涵盖了确定光伏（PV）阵列（或其组件串）绝缘电阻的程序，即阵列内部电气组件与阵列外露、导电、非载流部件和表面之间的电阻。 1.2 本试验方法不确定合格或不合格水平。可接受或不可接受结果的确定超出了本试验方法的范围。 1.3 以国际单位制表示的数值应视为标准值。本标准不包括其他计量单位。 1.4 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的用户有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 1.5 本国际标准是根据世界贸易组织技术性贸易壁垒（TBT）委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认标准化原则制定的。 ====意义和用途====== 5.1 旨在将太阳辐射能安全转换为有用电能的光伏组件或系统的设计必须考虑到，如果用户接触到阵列的电势，则可能存在危险。此外，绝缘系统为电化学腐蚀提供了屏障，绝缘缺陷可能导致腐蚀加剧和可靠性问题。本试验方法描述了一个程序，用于验证阵列的设计和构造是否通过正常安装和使用提供了足够的电气隔离。 阵列上的任何位置都不应接近光伏产生的电势，但输出引线明显例外。隔离对于安全可靠地安装、使用和维护光伏系统是必要的。 5.2 本试验方法描述了确定阵列提供电气危险防护能力的程序。其主要用途是发现可能对接触阵列的人员造成危险的绝缘缺陷。为解决此类缺陷而采取的纠正措施超出了本试验方法的范围。 5.3 该程序可指定为一系列验收测试的一部分，涉及性能测量和功能要求演示。可以在较小的段中测试大型阵列。待测试阵列段的尺寸（在本测试方法中称为“被测电路”）通常选择在一个方便的断点处，并且其尺寸应确保预期电阻或电流读数在仪表范围的中间三分之一之内。 5.4 绝缘泄漏电阻和绝缘泄漏电流泄漏与阵列尺寸、环境相对湿度、吸收的水汽和其他因素密切相关。因此，本试验方法的用户有责任规定本试验的最小可接受泄漏电阻。 5.4.1 即使指定了数字量，但实际结果往往是通过-失败的，因为当发现缺陷时，泄漏电流从几乎为零变为仪表上的满标度值。 5.5 此测试方法的用户必须指定在测试期间用于连接到阵列的选项。短路选项需要一个带引线的短路装置，以连接被测电路的正极和负极。对于较大的系统，短路装置可能必须具有高电流和电压等级的额定值，开路- 首选电路选项。开路选项要求用户校正读数，以说明PV产生的电压，并且进行此类校正的程序超出了本试验方法的范围。对于电压和电流水平较低且被测电路正负引线之间的距离较小的小型系统，短路选项可能更容易。短路选项将阵列组件暴露在高于其额定电压水平的电压水平下的可能性降至最低。

1.1 This test method covers a procedure to determine the insulation resistance of a photovoltaic (PV) array (or its component strings), that is, the electrical resistance between the array's internal electrical components and is exposed, electrically conductive, non-current carrying parts and surfaces of the array. 1.2 This test method does not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of this test method. 1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.5 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 5.1 The design of a PV module or system intended to provide safe conversion of the sun's radiant energy into useful electricity must take into consideration the possibility of hazard should the user come into contact with the electrical potential of the array. In addition, the insulation system provides a barrier to electrochemical corrosion, and insulation flaws can result in increased corrosion and reliability problems. This test method describes a procedure for verifying that the design and construction of the array provides adequate electrical isolation through normal installation and use. At no location on the array should the PV-generated electrical potential be accessible, with the obvious exception of the output leads. The isolation is necessary to provide for safe and reliable installation, use, and service of the PV system. 5.2 This test method describes a procedure for determining the ability of the array to provide protection from electrical hazards. Its primary use is to find insulation flaws that could be dangerous to persons who may come into contact with the array. Corrective action taken to address such flaws is beyond the scope of this test method. 5.3 This procedure may be specified as part of a series of acceptance tests involving performance measurements and demonstration of functional requirements. Large arrays can be tested in smaller segments. The size of the array segment to be tested (called “circuit under test” in this test method) is usually selected at a convenient break point and sized such that the expected resistance or current reading is within the middle third of the meter's range. 5.4 Insulation leakage resistance and insulation leakage current leakage are strong functions of array dimensions, ambient relative humidity, absorbed water vapor, and other factors. For this reason, it is the responsibility of the user of this test method to specify the minimum acceptable leakage resistance for this test. 5.4.1 Even though a numerical quantity is specified, actual results are often pass-fail in that when a flaw is found, the leakage current changes from almost nothing to the full scale value on the meter. 5.5 The user of this test method must specify the option used for connection to the array during the test. The short-circuited option requires a shorting device with leads to connect the positive and negative legs of the circuit under test. For larger systems, where the shorting device may have to be rated for high current and voltage levels, the open-circuited option may be preferred. The open-circuited option requires the user to correct readings to account for the PV-generated voltage, and the procedure for making such corrections is beyond the scope of this test method. The short-circuited option may be easier for small systems where the voltage and current levels are low and the distance between the plus and minus leads of the circuit under test are small. The short-circuited option minimizes the chance of exposing array components to voltage levels above those for which they are rated.