BS EN 60444-8:2017 describes test fixtures suitable for leadless surface mounted quartz
crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the
measurement of (series) resonance frequency, (series) resonance resistance, and equivalent
electrical circuit parameters L1, C1 and C0 using the measurement techniques specified in
IEC 60444-5 and for the determination of load resonance frequency and load resonance
resistance according to IEC TR 60444-4 and IEC 60444-11.Two test fixtures are described in this document:1) A fixture using the Π-network circuit with electrical values as described in IEC 60444-1 for
measurements in transmission mode up to 500 MHz. This fixture includes optional means
to add physical load capacitors for the measurement of load resonance parameters up to
30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more.
Calibration of the measurement system and CL adapter board is explained hereinafter.2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz.
No provisions for adding a physical load capacitance are anticipated. Load resonance
parameters can be measured by using the method of IEC 60444-11.Cross References:IEC 61837-2:2011IEC 60444-5:1995EN 61837-2 (IEC 61837-2:2011) AS EN 60444-1:1997EN 60444-2IEC 61837EN 61837IEC 61837-1:2012EN 61837-3 (IEC 61837-3:2015) ASIEC 61837-3:2015IEC 60444-9:2007EN 60444-7 (IEC 60444-7:2004) ASIEC 60444-7:2004IEC 60122-1:2002EN 60122-1 (IEC 60122-1:2002) ASIEC 60444-6:2013EN 60444-9 (IEC 60444-9:2007) ASIEC 60444-2:1980EN 61837-1 (IEC 61837-1:2012) ASEN 60444-6 (IEC 60444-6:2013) ASIEC 60444-1:1986All current amendments available at time of purchase are included with the purchase of this document.