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现行 IEC 62779-2:2016
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Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances 半导体器件 - 用于人体通信的半导体接口 - 第2部分:接口性能的表征
发布日期: 2016-02-18
IEC 62779-2:2016定义了构成人体通信(HBC)半导体接口的电极电气性能的测量方法。在该测量方法中,信号发射器与信号接收器电隔离,因此发射器与接收器之间保持隔离状态,以准确测量电极的性能。本部分包括测量方法的一般规范和功能规范。
IEC 62779-2:2016 defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). In the measurement method, a signal transmitter is electrically isolated from a signal receiver, so an isolation condition between the transmitter and receiver is maintained to accurately measure the electrode's performances. This part includes general and functional specifications of the measurement method.
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归口单位: TC 47
相似标准/计划/法规
现行
BS EN 62779-2-2016
Semiconductor devices. Semiconductor interface for human body communication-Characterization of interfacing performances
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IEC 62779-1-2016
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
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BS EN 62779-3-2016
Semiconductor devices. Semiconductor interface for human body communication-Functional type and its operational conditions
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现行
IEC 62779-3-2016
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
半导体器件人体通信用半导体接口第3部分:功能类型及其操作条件
2016-04-26
现行
DIN EN 62779-2
Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (IEC 62779-2:2016); German version EN 62779-2:2016
半导体器件.人体通信用半导体接口.第2部分:接口性能的表征(IEC 62779-2-2016);德文版EN 62779-2:2016
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现行
DIN EN 62779-1
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements (IEC 62779-1:2016); German version EN 62779-1:2016
半导体器件.人体通信用半导体接口.第1部分:一般要求(IEC 62779-1-2016);德文版EN 62779-1:2016
2017-01-01
现行
DIN EN 62779-3
Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions (IEC 62779-3:2016); German version EN 62779-3:2016
半导体器件.人体通信用半导体接口.第3部分:功能类型及其操作条件(IEC 62779-3-2016);德文版EN 62779-3:2016
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2018-04-30
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现行
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文件草案.半导体器件.机械和气候试验方法.第26部分:静电放电敏感性试验.人体模型(HBM).部件级(IEC 47/2101A/CDV:2011)
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DIN EN IEC 60749-26
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018
半导体器件.机械和气候试验方法.第26部分:静电放电(ESD)灵敏度试验.人体模型(HBM)(IEC 60749-26-2018);德文版EN IEC 60749-26:2018
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