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现行 ISO 13696:2022
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Optics and photonics — Test method for total scattering by optical components 光学和光子学.光学元件总散射的试验方法
发布日期: 2022-06-01
本文件规定了涂层和未涂层光学表面总散射的测定程序。给出了测量前向散射或后向散射对光学元件总散射贡献的程序。 本文件适用于光学表面曲率半径大于10°的有涂层和无涂层光学元件m、 本文件涵盖的测量波长范围为250°以上的紫外线nm到红外光谱区低于15μm。对于190?之间的深紫外测量nm到250考虑并描述了具体方法。一般来说,对于15°以上的波长,光散射被认为是可以忽略的μm。
This document specifies procedures for the determination of the total scattering by coated and uncoated optical surfaces. Procedures are given for measuring the contributions of the forward scattering or backward scattering to the total scattering of an optical component. This document applies to coated and uncoated optical components with optical surfaces that have a radius of curvature of more than 10?m. Measurement wavelengths covered by this document range from the ultraviolet above 250?nm to the infrared spectral region below 15?μm. For measurements in the deep ultraviolet between 190?nm to 250?nm, specific methods are considered and are described. Generally, optical scattering is considered as neglectable for wavelengths above 15?μm.
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归口单位: ISO/TC 172/SC 9
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