CISPR 17:2011规定了电力线、信号线和其他电路中使用的无源EMC滤波设备的无线电干扰抑制特性的测量方法。所定义的方法也可应用于过压保护装置和EMC滤波装置的组合。根据设备和测试电路的不同，测量方法覆盖的频率范围从9 kHz到几GHz。本标准描述了实验室试验（型式试验）和工厂试验的程序。用于抑制电磁干扰的EMC滤波器和部件的抑制特性是许多变量的函数，如它们所连接电路的阻抗、工作电压和电流以及环境温度。 本标准规定了统一的试验方法，以便能够比较由试验实验室确定或制造商规定的过滤和抑制特性。测量程序适用于无偏和有偏条件。在偏置条件下进行测量，以确定EMC滤波设备的潜在非线性行为，例如带磁芯的电感器中的饱和效应。该测试旨在展示在特定应用中的可用性（例如产生高共模脉冲电流振幅的变频器，因此可能会使电感器饱和）。 如果非线性行为可以通过其他方法确定（例如，单独测量所用电感器的饱和），则可以省略偏置条件下的测量。CISPR 17（1981）第一版规定了主要用于电力线滤波器的插入损耗测量方法。然而，如今，在各种电子设备中可以找到许多类型的复杂EMC滤波器和抑制组件。这些过滤器需要使用标准化的测量方法进行表征。阻抗和阻抗测量的新方法- 此类EMI设备的参数包含在第二版中。

CISPR 17:2011 specifies methods to measure the radio interference suppression characteristics of passive EMC filtering devices used in power and signal lines, and in other circuits. The defined methods may also be applied to combinations of over-voltage protection devices and EMC filtering devices. The measurement method covers the frequency range from 9 kHz to several GHz depending on the device and test circuit. The standard describes procedures for laboratory tests (type tests) as well as factory tests. The suppression characteristics of EMC filters and components used for the suppression of EM disturbances, are a function of numerous variables such as impedance of the circuits to which they connect, operating voltage and current, and ambient temperature. This standard specifies uniform test methods that will enable comparison of filtering and suppression characteristics determined by test laboratories or specified by manufacturers. Measurement procedures are provided for unbiased and bias conditions. Measurements under bias conditions are performed to determine potential non-linear behaviour of the EMC filtering devices such as saturation effects in inductors with magnetic cores. This testing serves to show the usability in a specific application (such as frequency converters that produce high amplitudes of common mode pulse current and thus may drive inductors into saturation). Measurement under bias conditions may be omitted if the non-linear behaviour can be determined by other methods (e.g. separate saturation measurement of the inductors used). The first edition of CISPR 17 (1981) prescribed the measurement methods of insertion loss mainly for power-line filters. Today, however, many types of sophisticated EMC filters and suppression components can be found in various electronic devices. Those filters need to be characterized using standardized measurement methods. New methods for measurement of impedance and S-parameters for such EMI devices are included in this second edition.