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现行 IEC 62788-1-7:2020
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Measurement procedures for materials used in photovoltaic modules - Part 1-7: Encapsulants - Test procedure of optical durability 光伏组件用材料的测量程序.第1-7部分:封装材料.光学耐久性试验程序
发布日期: 2020-04-21
IEC 62788-1-7:20 20被设计为更严格的资格测试,使用高温下的加速紫外线暴露来确定聚合物密封剂是否会损失透光率。IEC 61215-2已经包括紫外线预处理测试(MQT 10),然而,该测试的参数仅代表有限的暴露水平(约数周的紫外线剂量)。该测试程序旨在用于代表性试样,以更大强度施加应力(相对于亚利桑那州凤凰城设计),使用更类似于地面太阳光谱的辐射光谱,并使用与PV应用更相关的暴露持续时间(即相当于几年的室外暴露)。该测试量化了密封剂的降解速率,以便可以控制材料在陆地环境中操作期间失去透光率的风险。气候(或使用位置)、特定应用(公用设施安装、住宅安装、屋顶安装、机架安装、跟踪器的使用、系统电气配置及其操作)和测试之间的定量相关性可以针对每种特定的封装材料建立,但超出了本文档的范围。
IEC 62788-1-7:2020 is designed as a more rigorous qualification test, using accelerated UV exposure at elevated temperature to determine whether polymeric encapsulants can suffer loss of optical transmittance. IEC 61215-2 already includes a UV preconditioning test (MQT 10), however, the parameters for that test only represent a limited level of exposure (~weeks of UV dose). This test procedure is intended for representative coupon specimens, applying stress at a greater intensity (designed relative to Phoenix, AZ), using a radiation spectrum that is more similar to the terrestrial solar spectrum, and using a duration of exposure that is more relevant to the PV application (i.e., equivalent to several years of outdoor exposure). This test quantifies the degradation rate of encapsulants so that the risk of the materials losing optical transmittance during operation in the terrestrial environments can be managed. The quantitative correlation between climate (or location of use), a specific application (utility installation, residential-installation, roof-mount, rack-mount, use of a tracker, the system electrical configuration and its operation), and the test can be established for each specific encapsulant material, but is beyond the scope of this document.
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归口单位: TC 82
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