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被代替 GB/T 4377-1996
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半导体集成电路 电压调整器测试方法的基本原理 Semiconductor integrated circuits General principles of measuring methods of voltage regulator
发布日期: 1996-07-09
实施日期: 1997-01-01
废止日期: 2018-08-01
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现行
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半导体集成电路时基电路测试方法的基本原理
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现行
GB/T 6798-1996
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Semiconductor integrated circuits--General principles of measuring methods of voltage comparators
1996-07-09
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GB/T 14029-1992
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1992-12-17
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GB/T 14031-1992
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1992-12-17
现行
GB/T 14115-1993
半导体集成电路采样/保持放大器测试方法的基本原理
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1993-01-21
现行
SJ/T 10400-1993
半导体音响电路图示均衡电路测试方法的基本原理
General principles of measuring methods for graphic equalizers of semiconductor audio integrated circuits
1993-09-28
现行
GB/T 14032-1992
半导体集成电路数字锁相环测试方法的基本原理
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1992-12-17
现行
SJ/T 10402-1993
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General principles of measuring methods for automatic music selectors of semiconductor audio integrated circuits
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现行
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General principles of measuring methods for motor speed stablizers of semiconductor audio integrated circuits
1993-09-28
现行
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半导体集成电路电压/频率和频率/电压转换器测试方法的基本原理
General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits
1993-01-21
现行
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集成电路A/D和D/A转换器测试方法的基本原理
General principles of measuring methods of A/D and D/A converters for integrated circuits
2006-08-07