IEC？62396-2:20 17(E)旨在提供与电子元件测试相关的指导，以测量其对地球大气中宇宙射线相互作用产生的中子（大气中子）诱导的单事件效应(SEE)的敏感性。由于测试可以使用不同种类的辐射源以多种不同的方式进行，因此它还显示了如何使用测试数据来估计飞机高度大气中子引起的电子元件和电路板的SEE速率。虽然该工艺是为航空电子工业开发的，但也可应用于其他工业部门。

IEC？62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.