ISO/IEC 16963:2017规定了一种加速老化测试方法，用于估计存储在可记录或可重写光盘上的信息的可检索性的寿命。 该方法基于记录在光盘上的数据的寿命具有对数正态分布的理论假设。 规定了以下格式的详细测试:DVD-R/RW/RAM磁盘、+R/+RW磁盘、CD-R/RW磁盘和BD可记录/可重写磁盘。该测试可以应用于替代适当规格的其他光盘格式，也可以由委员会在未来根据需要进行更新。 ISO/IEC 16963:2017包括: -强制降解条件: -使用Eyring和Arrhenius方法进行测试和随后分析的基本和严格应力条件；-估计存储在光盘上的数据的寿命的环境存储条件: -受控储存条件，温度=25℃且相对湿度=50%，代表全时空调。Eyring方法用于估计该储存条件下的寿命； -恶劣的存储条件，温度=30℃，相对湿度=80%，代表用户处理和存储光盘的最恶劣条件。采用Arrhenius方法估算该储存条件下的寿命； -评估系统的描述； -标本制备和数据采集程序； -用于测试特定磁盘类型的定义和方法； -分析测试结果以确定存储数据的寿命； -用于报告所存储数据的估计寿命的格式。该方法仅包括温度和相对湿度的影响。它不试图模拟由于复杂故障机制动力学引起的退化，也不测试暴露于光、腐蚀性气体、污染物、处理或回放子系统的变化。暴露于这些额外应力源或更高水平的温度和相对湿度的盘预期经历较短的可用寿命。

ISO/IEC 16963:2017 specifies an accelerated ageing test method for estimating the lifetime of the retrievability of information stored on recordable or rewritable optical disks. The method is based on the theoretical assumption that the lifetime of data recorded on an optical disk has a lognormal distribution. Detailed testing is specified for the following formats: DVD-R/RW/RAM disks, +R/+RW disks, CD-R/RW disks and BD recordable/rewritable disks. The testing can be applied to additional optical-disk formats with substitution of the appropriate specifications and can also be updated by the committee in the future as required. ISO/IEC 16963:2017 includes: - stress conditions:

• - Basic and Rigorous stress-conditions for testing and subsequent analysis using both the Eyring and Arrhenius methods;

- ambient storage conditions in which the lifetime of data stored on optical disk is estimated:

• - a Controlled storage-condition, Temp = 25 °C and RH = 50 %, representing full-time air conditioning. The Eyring method is used to estimate the lifetime under this storage condition;
• - a Harsh storage-condition, Temp = 30 °C and RH = 80 %, representing the most severe conditions in which users handle and store optical disks. The Arrhenius method is used to estimate the lifetime under this storage condition;

- a description of the evaluation system; - procedures for specimen preparation and data acquisition; - definitions and methods used in testing specific disk types; - analysis of test results to determine the lifetime of stored data; - a format for reporting the estimated lifetime of stored data. The methodology includes only the effects of temperature and relative humidity. It does not attempt to model degradation due to complex failure mechanism kinetics, nor does it test for exposure to light, corrosive gases, contaminants, handling, or variations in playback subsystems. Disks exposed to these additional sources of stress or higher levels of temperature and relative humidity are expected to experience shorter usable lifetime.