IEC TS 62607-6-6:20 21(E)建立了确定结构关键控制特性的标准化方法 ？应变均匀性 对于单层石墨烯 ？拉曼光谱。 分析拉曼光谱中2D峰的宽度以计算应变均匀性参数，该参数是量化纳米尺度应变变化对层的电子性质的影响的品质因数。该分类将帮助制造商对其材料质量进行分类，以提供所表征的石墨烯的电子性能的上限，从而决定石墨烯材料质量是否潜在地适合于各种应用。

IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic
？ strain uniformity
for single-layer graphene by
？ Raman spectroscopy.
The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.