现行

BS EN 62132-5-2006

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Workbench Faraday cage method
集成电路 电磁抗扰度测量 150 kHz至1 GHz

2006-03-31

现行

BS EN 62132-4-2006

Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz-Direct RF power injection method
集成电路 电磁抗扰度的测量 150千赫至1千兆赫

2006-07-31

现行

BS EN 62132-3-2007

Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Bulk current injection (BCI) method
集成电路 电磁抗扰度测量 150 kHz至1 GHz

2007-11-30

现行

IEC 62132-5-2005

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
集成电路 - 电磁抗扰度测量 150 Khz至1 Ghz - 第5部分:工作台法拉第笼式

2005-10-10

现行

IEC 62132-4-2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
集成电路 - 电磁抗扰度测量150 Khz至1 Ghz - 第4部分:直接Rf功率注入法

2006-02-21

现行

BS 03/105045 DC

IEC 62132-3. Ed.1. Integrated circuits. Measurement of electromagnetic immunity, 150 KHz to 1 GHz. Part 3. Measurement of conducted immunity. Bulk current injection method
IEC 62132-3 Ed.1 集成电路 电磁抗扰度测量 150 KHz至1 GHz 第三部分 传导抗扰度的测量 大电流注入法

2003-08-11

现行

BS EN 62132-8-2012

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. IC stripline method
集成电路 电磁抗扰度的测量

2012-10-31

现行

BS EN 61967-5-2003

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of conducted emissions. Workbench Faraday Cage method
集成电路 电磁辐射测量 150 kHz至1 GHz

2003-06-17

现行

BS EN 62132-1-2016

Integrated circuits. Measurement of electromagnetic immunity-General conditions and definitions
集成电路 电磁抗扰度的测量

2016-03-31

现行

DIN IEC 62132-2-DRAFT

Draft Document - Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)
文件草稿.集成电路.150 kHz至1 GHz电磁抗扰度的测量.第2部分:辐射抗扰度的测量.Tem室和宽带Tem室法（IEC 47A/748/CD:2006）

2006-08-01

现行

IEC 61967-6-2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路 - 电磁辐射测量 150赫兹至1 Ghz - 第6部分:传导发射测量 - 磁探针法

2002-06-25

现行

IEC 61967-6-2002+AMD1-2008 CSV

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
集成电路.150kHz至1GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法

2008-06-24

现行

KS C IEC 61967-4(2019 Confirm)

집적 회로－150 kHz에서 1 GHz의 전기 자기 장해 측정－제4부：전도 장해 측정－1 W/150 W 직접 결합 방법
集成电路150kHz～1GHz电磁发射测量第4部分:传导发射测量1W/150W直接耦合法

2004-11-30

现行

IEC 62132-8-2012

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
集成电路 - 电磁抗扰度测量 - 第8部分:辐射抗扰度测量 - IC带状线法

2012-07-06

现行

IEC TS 62132-9-2014

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法

2014-08-21

现行

GB/T 42968.8-2023

集成电路 电磁抗扰度测量 第8部分：辐射抗扰度测量 IC带状线法
Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method

2023-09-07

现行

BS EN 61967-2-2005

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz-Measurement of radiated emissions. TEM cell and wideband TEM cell method
集成电路 电磁辐射测量 150 kHz至1 GHz

2006-01-23

现行

BS EN 62132-2-2011

Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. TEM cell and wideband TEM cell method
集成电路 电磁抗扰度的测量

2011-04-30

现行

IEC 61967-6-2002/AMD1-2008

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
修改件1.集成电路.150 kHz至1 GHz电磁发射的测量.第6部分:传导发射的测量.磁探针法

2008-03-12

现行

IEC 62132-1-2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

2015-10-29