本电阻器噪声试验方法旨在确定电阻器的“噪声”或“噪声质量”，以确定其是否适用于具有关键噪声要求的电子电路。本方法旨在作为确定电阻器中电流噪声的标准参考，用于具有特定电流噪声要求的应用中。它不是一般规范要求。由于在部件中产生杂散噪声信号而引起的干扰往往会掩盖所需的输出信号，从而导致信息丢失。 对于使用低噪声部件的低电平音频和其他低频电路，电阻器可能成为干扰噪声的重要来源。电阻器中的一个噪声源是分子热运动，该运动产生一种称为“热噪声”的波动电压。无需通过测量确定热噪声的大小，因为波动电压的均方值可从奈奎斯特方程中预测，该方程显示均方值与电阻、温度和测量系统通带的乘积成正比。 通常，当直流电（dc）通过电阻电路元件时，波动电压会增加。波动电压的增加被称为“过剩噪声”或“电流噪声”。电流噪声的大小取决于电阻器的许多固有特性，如电阻材料和其他因素，如电阻元件的加工、制造、尺寸和形状等。由于电流噪声和其中许多因素之间没有明显的函数关系，通常无法从物理常数预测电流噪声。 因此，有必要测量电流噪声以确定其大小。本测试中采用的方法旨在准确评估ind的“噪音”或“噪音质量”。

This resistor noise test method is performed for the purpose of establishing the "noisiness" or "noise quality" of a resistor in order to determine its suitability for use in electronic circuits having critical noise requirements. This method is intended as a standard reference for the determination of current noise present in a resistor, for use in an application with specific current-noise requirements. It is not intended as a general specification requirement. Interference caused by the generation of spurious noise signals in parts tends to mask the desired output signal, thus resulting in loss of information. For low-level audio frequency and other low-frequency circuits, where low-noise parts are used, resistors may become an important source of interfering noise. One source of noise in a resistor is molecular thermal motion which generates a fluctuation voltage termed "thermal noise". It is not necessary to determine the magnitude of thermal noise by measurement since the mean-square value of the fluctuation voltage is predictable from Nyquist's equation, which shows the mean-square value to be proportional to the product of resistance, temperature, and the pass band of the measuring system. Generally, an increase in fluctuation voltage appears when direct current (dc) is passed through resistive circuit elements. The increase in fluctuation voltage is termed "excess noise" or "current noise". The magnitude of current noise is dependent upon many inherent properties of the resistor such as resistive material and other factors such as processing, fabrication, size and shape of resistive element, etc. Since there is no apparent functional relationship between current noise and many of these factors, current noise generally cannot be predicted from physical constants. Therefore, it is necessary to measure current noise to determine its magnitude. The method employed in this test has been designed to evaluate accurately the "noisiness" or "noise quality" of ind.