本文件描述了使用电子光谱技术确定“核壳”纳米颗粒（包括一些变体和非理想形态）涂层厚度和化学成分的方法。它确定了与每种方法相关的假设、挑战和不确定性。它还描述了使用电子光谱仪对纳米颗粒样品进行一般分析的协议和问题，特别是它们对涂层厚度测量的重要性。 本文重点介绍电子光谱技术的使用，特别是X射线光电子能谱、俄歇电子能谱和基于同步加速器的方法。这些方法无法提供准确分析所需的所有信息，因此，根据其帮助解释电子光谱数据的能力，概述了一些额外的分析方法。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This document provides a description of methods by which the coating thickness and chemical composition of "core-shell" nanoparticles (including some variant and non-ideal morphologies) can be determined using electron spectroscopy techniques. It identifies the assumptions, challenges, and uncertainties associated with each method. It also describes protocols and issues for the general analysis of nanoparticle samples using electron spectroscopies, specifically in relation to their importance for measurements of coating thicknesses. This document focuses on the use of electron spectroscopy techniques, specifically X-ray photoelectron spectroscopy, Auger electron spectroscopy, and synchrotron-based methods. These cannot provide all of the information necessary for accurate analysis and therefore some additional analytical methods are outlined in the context of their ability to aid in the interpretation of electron spectroscopy data.All current amendments available at time of purchase are included with the purchase of this document.