IEC 61338-1-5:20 15描述了导体层和电介质衬底之间的界面处的电阻和有效电导率的测量方法，其被称为界面电阻和界面电导率。第一版取消并取代了2010年发布的IEC PAS 61338-1-5。与上一版相比，此版本包括以下重大技术变更: a)在引言中描述与专利(日本专利号JP3634966、JP3735501)相关的技术内容； b)规范性参考文献的变更； c)增加参考书目。

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition:
a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;
b) changes to normative references;
c)addition to bibliography.