IEC 61788-4:20 16规定了测定具有Cu、Cu-Ni、Cu/Cu-Ni和Al基体的Nb-Ti和Nb3Sn复合超导体的残余电阻比(RRR)的测试方法。该方法旨在用于具有矩形或圆形横截面的整体结构、RRR值小于350且横截面面积小于3mm2的超导体样品。在Nb3Sn的情况下，样品已经接受了反应热处理。这第四版取消并取代了2011年出版的第三版。本版构成技术修订版。

IEC 61788-4:2016 specifies a test method for the determination of the residual resistance ratio (RRR) of Nb-Ti and Nb₃Sn composite superconductors with Cu, Cu-Ni, Cu/Cu-Ni and Al matrix. This method is intended for use with superconductor specimens that have a monolithic structure with rectangular or round cross-section, RRR value less than 350, and cross-sectional area less than 3 mm². In the case of Nb₃Sn, the specimens have received a reaction heat-treatment. This fourth edition cancels and replaces the third edition published in 2011. This edition constitutes a technical revision.