Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
半导体器件.第16-8部分:微波集成电路.限制器

2022-11-29

Draft Document - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/374/CD:2008)
文件草案.半导体器件.第16-5部分:微波集成电路.振荡器（IEC 47E/374/CD:2008）

2009-03-01

Draft Document - Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 47E/734/CD:2020); Text in English
文件草案-半导体器件-第16-7部分:微波集成电路-衰减器（IEC 47E/734/CD:2020）；英文文本

2021-07-01

Draft Document - Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021); Text in German and English
文件草案.半导体器件.第16-9部分:微波集成电路.移相器（IEC 47E/768/CD:2021）；德语和英语文本

2022-06-01

Draft Document - Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors (IEC 47E/265/CD:2004)
文件草案.半导体器件.分立器件.第4部分:微波二极管和晶体管（IEC 47E/265/CD:2004）

2005-01-01

Draft Document - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors (IEC 47E/320/CD:2007)
文件草案.半导体器件.分立器件.第8部分:场效应晶体管（IEC 47E/320/CD:2007）

2007-06-01

Draft Document - Mechanical standardization of semiconductor devices - Part 6-16: Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA (IEC 47D/835/CD:2013)
文件草案.半导体器件的机械标准化.第6-16部分:BGA LGA FBGA和FLGA用半导体试验和老化插座术语表（IEC 47D/835/CD:2013）

2013-08-01

Draft Document - FIbre optic active components and devices - Performance standard - Part 8: Seeded reflective semiconductor optical amplifier devices (IEC 86C/1101/CD:2013)
文件草案.光纤有源元件和器件.性能标准.第8部分:种子反射半导体光放大器器件（IEC 86C/1101/CD:2013）

2013-05-01

Draft Document - Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 47/1961/CD:2008)
文件草稿.半导体器件.微机电器件.第8部分:薄膜拉伸性能测量的带材弯曲试验方法（IEC 47/1961/CD:2008）

2008-05-01