1.1 本文件的目的是为原子力显微镜（AFM）的定量应用提供指导，以确定纳米颗粒的尺寸 2. 使用高度（z位移）测量以干燥形式沉积在平坦基板上。与电子显微镜提供样品的二维投影或二维图像不同，AFM提供三维表面轮廓。虽然横向尺寸受到探针形状的影响，但位移测量可以提供高度精确的纳米颗粒高度。 如果假设粒子是球形的，则高度测量值对应于粒子的直径。在本指南中，描述了将金纳米颗粒分散在各种表面上的程序，使其适用于通过间歇接触模式AFM进行成像和高度测量。然后讨论了AFM校准的一般程序和进行此类测量的操作。最后，讨论了数据分析和报告程序。用于举例说明这些程序的纳米颗粒是含有柠檬酸盐的美国国家标准与技术研究所（NIST）参考材料- 在水溶液中稳定带负电荷的金纳米粒子。 1.2 以国际单位制表示的数值应视为标准。本标准中不包括其他计量单位。 1.3 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的使用者有责任在使用前制定适当的安全、健康和环境实践，并确定监管限制的适用性。 1.4 本国际标准是根据世界贸易组织技术性贸易壁垒委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认的标准化原则制定的。 ===意义和用途====== 5.1 随着AFM测量技术的成熟和普及，该技术已被纳米技术研发界广泛采用，目前已被认为是在纳米尺度上可视化和量化结构的不可或缺的工具。 无论是作为一种独立的方法还是作为其他尺寸测量方法的补充，AFM现在都是纳米颗粒测量工具箱中一个稳固的组成部分。截至本指南起草之时，基于AFM测定纳米颗粒尺寸的国际标准尚不存在。因此，本标准旨在为AFM的应用提供实用和计量指导，以基于探针在颗粒表面光栅化以形成线轮廓时的最大位移来测量衬底支撑的纳米颗粒的尺寸。

1.1 The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles 2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike electron microscopy, which provides a two-dimensional projection or a two-dimensional image of a sample, AFM provides a three-dimensional surface profile. While the lateral dimensions are influenced by the shape of the probe, displacement measurements can provide the height of nanoparticles with a high degree of accuracy and precision. If the particles are assumed to be spherical, the height measurement corresponds to the diameter of the particle. In this guide, procedures are described for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM. Generic procedures for AFM calibration and operation to make such measurements are then discussed. Finally, procedures for data analysis and reporting are addressed. The nanoparticles used to exemplify these procedures are National Institute of Standards and Technology (NIST) reference materials containing citrate-stabilized negatively charged gold nanoparticles in an aqueous solution. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 5.1 As AFM measurement technology has matured and proliferated, the technique has been widely adopted by the nanotechnology research and development community to the extent that it is now considered an indispensible tool for visualizing and quantifying structures on the nanoscale. Whether used as a stand-alone method or to complement other dimensional measurement methods, AFM is now a firmly established component of the nanoparticle measurement tool box. International standards for AFM-based determination of nanoparticle size are nonexistent as of the drafting of this guide. Therefore, this standard aims to provide practical and metrological guidance for the application of AFM to measure the size of substrate-supported nanoparticles based on maximum displacement as the probe is rastered across the particle surface to create a line profile.