现行

BS ISO 22493-2014

Microbeam analysis. Scanning electron microscopy. Vocabulary
微束分析 扫描电子显微镜 词汇

2014-04-30

现行

KS D ISO 22493

마이크로빔 분석 —주사전자현미경 — 용어
微束分析.扫描电子显微镜.词汇

2022-08-22

现行

KS D ISO 22493(2017 Confirm)

마이크로빔 분석－주사전자현미경－용어
微束分析扫描电子显微镜词汇

2012-12-07

现行

GB/T 23414-2009

微束分析 扫描电子显微术 术语
Microbeam analysis - Scanning electron microscopy - Vocabulary

2009-04-01

现行

ISO 22493-2014

Microbeam analysis — Scanning electron microscopy — Vocabulary
微束分析——扫描电子显微镜——词汇

2014-04-09

现行

GB/T 33834-2017

微束分析 扫描电子显微术 生物试样扫描电子显微镜分析方法
Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens

2017-05-31

现行

ISO/TS 21383-2021

Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements
用于定量测量的扫描电子显微镜鉴定

2021-03-12

现行

GB/T 35099-2018

微束分析 扫描电镜-能谱法 大气细粒子单颗粒形貌与元素分析
Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air

2018-05-14

现行

BS ISO 16700-2016

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
微束分析 扫描电子显微镜 校准图像放大率的指南

2016-07-31

现行

KS D ISO 16700(2018 Confirm)

마이크로빔 분석－주사전자현미경－영상 배율 교정 지침
微束分析－扫描电子显微镜－图像放大率校准指南

2013-06-05

现行

KS D ISO 16700

마이크로빔 분석 — 주사전자현미경 — 영상 배율 교정 지침
微束分析扫描电子显微镜图像放大率校准指南

2023-11-20

现行

GB/T 33838-2017

微束分析 扫描电子显微术 图像锐度评估方法
Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness

2017-05-31

现行

GB/T 27788-2020

微束分析 扫描电镜 图像放大倍率校准导则
Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

2020-06-02

现行

ISO/TS 24597-2011

Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
微束分析——扫描电子显微镜——图像清晰度的评价方法

2011-06-07

现行

ISO 16700-2016

Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
微束分析 - 扫描电子显微镜 - 校准图像放大率的指南

2016-07-18

现行

BS ISO 21466-2019

Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
微束分析 扫描电子显微镜 用CDSEM评估临界尺寸的方法

2019-12-18

现行

ASTM E1588-20

Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
通过扫描电子显微镜/能量色散X射线光谱法进行枪支残留分析的标准实践

2020-09-15

现行

ISO 21466-2019

Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
微束分析.扫描电子显微镜.用CD-SEM评定临界尺寸的方法

2019-12-13

现行

BS ISO 23420-2021

Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
微束分析 分析电子显微镜 电子能量损失谱分析中能量分辨率的测定方法

2021-05-05

现行

ISO 23420-2021

Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
微束分析.分析电子显微镜.电子能量损失谱分析用能量分辨率的测定方法

2021-04-23