本文件涵盖以下相位阵列探头，用于接触技术（有或没有楔形）或浸没技术中的超声波无损检测，中心频率范围为0.5 MHz〜10 MHz。 - 线性， - 环绕， - 2D矩阵， - 部分环形部门（类型“雏菊”） 本文件规定了在相控阵探头制造结束时必须完成的特性测试。它定义了方法和验收标准。 本文件没有描述表征超声相控阵仪器的性能或组合系统性能的方法和验收标准。这些描述在EN ISO 18563-1和EN ISO 18563-3中

ISO 18563-2:2017 specifies the characterization tests performed at the end of the fabrication of a phased array probe. It defines both methodology and acceptance criteria. ISO 18563-2:2017 is applicable to the following phased array probes used for ultrasonic non-destructive testing in contact technique (with or without a wedge) or in immersion technique, with centre frequencies in the range 0,5 MHz to 10 MHz: a) non-matrix array probes: - linear; - encircling; - partial annular sectorial (type "daisy"); b) 2D-matrix array probes. ISO 18563-2:2017 does not give methods and acceptance criteria to characterize the performance of an ultrasonic phased array instrument or the performance of a combined system. These are given in ISO 18563?1 and in ISO 18563?3.