首页 馆藏资源 舆情信息 标准服务 科研活动 关于我们
现行 BS EN 62132-2:2011
到馆阅读
收藏跟踪
购买正版
Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. TEM cell and wideband TEM cell method 集成电路 电磁抗扰度的测量
发布日期: 2011-04-30
参考参考:IEC 6 6 6 6 6 6 6 6 6 6 6 6-1 1 1:2007年7 7 6 6 6 6 6 6 6 6 6-1-1 1 1:2007 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6-4 4 4 4-4 4 4-4 4 4-4 4-4 4 4-4 4-4-4-4-4-4-4-4-4-4-4-4-4-4-4-4-4-4-20 20 20 20 20-20 20 20-20-20-20-3 3 3 3 3 3 3 3 3 3 3 3-3 3 3 3-3 3-3 3 3 3-3-4-6 6 6 6 6 6-4-6-4-4-4-4-4-4-4-4-4-6-6-6-6-6-6-6-6-6-6-6-6-6-7 7-4-3:2006/A1:2008EN61000-4-6:2009EN 61000-4-20:2003EN 55016-1-1:2007EN 55016-1-5:2004EN 55016-2-1:2009EN 55016-2-3:2006EN 55016-2-4:2004购买本文件时可提供的所有当前修订均包含在购买本文件中。
Cross References:IEC 60050-131:2002IEC 60050-161:1990IEC 61967-2IEC 62132-1:2006EN 61967-2EN 62132-1:2006EN 62132-1:2006/Corrigendum:2006IEC 61000-4-3:2006IEC 61000-4-3:2006/AMD 1:2007IEC 61000-4-6:2008IEC 61000-4-20:2003CISPR 16-1-1:2007CISPR 16-1-2:2006CISPR 16-1-5:2003CISPR 16-2-1:2008CISPR 16-2-2:2005CISPR 16-2-3:2006CISPR 16-2-4:2003EN 61000-4-3:2006EN 61000-4-3:2006/A1:2008EN 61000-4-6:2009EN 61000-4-20:2003EN 55016-1-1:2007EN 55016-1-5:2004EN 55016-2-1:2009EN 55016-2-3:2006EN 55016-2-4:2004All current amendments available at time of purchase are included with the purchase of this document.
分类信息
发布单位或类别: 英国-英国标准学会
关联关系
研制信息
相似标准/计划/法规
现行
BS EN 62132-8-2012
Integrated circuits. Measurement of electromagnetic immunity-Measurement of radiated immunity. IC stripline method
集成电路 电磁抗扰度的测量
2012-10-31
现行
BS EN 62132-1-2016
Integrated circuits. Measurement of electromagnetic immunity-General conditions and definitions
集成电路 电磁抗扰度的测量
2016-03-31
现行
IEC TS 62132-9-2014
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法
2014-08-21
现行
IEC 62132-8-2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
集成电路 - 电磁抗扰度测量 - 第8部分:辐射抗扰度测量 - IC带状线法
2012-07-06
现行
GB/T 42968.8-2023
集成电路 电磁抗扰度测量 第8部分:辐射抗扰度测量 IC带状线法
Integrated circuits—Measurement of electromagnetic immunity—Part 8: Measurement of radiated immunity—IC stripline method
2023-09-07
现行
IEC 62132-1-2015
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义
2015-10-29
现行
GB/T 42968.1-2023
集成电路 电磁抗扰度测量 第1部分:通用条件和定义
Integrated circuits—Measurement of electromagnetic immunity—Part 1: General conditions and definitions
2023-09-07
现行
IEC 62132-2-2010
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
集成电路 - 电磁抗扰度测量 - 第2部分:辐射抗扰度测量 - 温度计和宽带电池法
2010-03-30
现行
GB/T 42968.2-2024
集成电路 电磁抗扰度测量 第2部分:辐射抗扰度测量 TEM小室和宽带TEM小室法
Integrated circuits—Measurement of electromagnetic immunity—Part 2: Measurement of radiated immunity—TEM cell and wideband TEM cell method
2024-10-26
现行
BS 09/30191126 DC
BS EN 62132-8. Integrated circuits. Measurement of electromagnetic immunity. Part 8. Measurement of radiated immunity. IC Stripline method
英国标准EN 62132-8 集成电路 电磁抗扰度的测量 第八部分 辐射抗扰度的测量 集成电路带线法
2009-02-03
现行
BS 12/30268333 DC
BS EN 62132-1. Integrated circuits. Measurement of electromagnetic immunity. General conditions and definitions
英国标准EN 62132-1 集成电路 电磁抗扰度的测量 一般条件和定义
2012-07-11
现行
DIN IEC/TS 62132-9
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)
集成电路电磁抗扰度测量第9部分:辐射抗扰度测量表面扫描法(IEC/TS 62132-9-2014)
2015-08-01
现行
BS EN 62132-5-2006
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Workbench Faraday cage method
集成电路 电磁抗扰度测量 150 kHz至1 GHz
2006-03-31
现行
BS EN 62132-4-2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz-Direct RF power injection method
集成电路 电磁抗扰度的测量 150千赫至1千兆赫
2006-07-31
现行
BS EN 62132-3-2007
Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz-Bulk current injection (BCI) method
集成电路 电磁抗扰度测量 150 kHz至1 GHz
2007-11-30
现行
DIN IEC 62132-8-DRAFT
Draft Document - Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)
文件草案——集成电路——电磁抗扰度测量——第8部分:辐射抗扰度测量——IC带状线法(IEC 47A/811/CD:2009)
2009-05-01
现行
IEC 62132-5-2005
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
集成电路 - 电磁抗扰度测量 150 Khz至1 Ghz - 第5部分:工作台法拉第笼式
2005-10-10
现行
BS DD IEC/TS 62215-2-2007
Integrated circuits. Measurement of impulse immunity-Synchronous transient injection method
集成电路 脉冲抗扰度的测量 同步瞬态注入法
2007-11-30
现行
IEC 62132-4-2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
集成电路 - 电磁抗扰度测量150 Khz至1 Ghz - 第4部分:直接Rf功率注入法
2006-02-21
现行
BS EN IEC 61967-1-2019
Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions
集成电路 电磁辐射的测量 一般条件和定义
2019-02-21