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现行 IEC TS 62607-6-11:2022
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Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy 纳米制造.关键控制特性.第6-11部分:石墨烯.缺陷密度:拉曼光谱
发布日期: 2022-02-08
IEC TS 62607-6-11:20 22(EN)建立了确定关键控制特性的标准化方法 ?缺陷密度nD 通过化学气相沉积生长的石墨烯膜以及通过 ?拉曼光谱
IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
? defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
? Raman spectroscopy
分类信息
发布单位或类别: 国际组织-国际电工委员会
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研制信息
归口单位: TC 113
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