1.1本试验方法描述了一种高精度技术，用于在600至1400 K的温度范围内，在1至35μm的波长下测量导电材料或具有导电基材的材料的正常光谱发射率。 1.2试验方法需要昂贵的设备和相当详细的预防措施，但产生的数据准确度在几%以内。它适用于需要最高精度和准确度的研究实验室，但不建议用于常规生产或验收测试。然而，由于其高精度，该测试方法可作为仲裁方法，在发生争议的情况下应用于生产和验收测试。 1.3以国际单位制表示的数值应视为标准。 括号中的值仅供参考。 1.4 本标准并非旨在解决与其使用相关的所有安全问题（如有）。本标准的用户有责任在使用前制定适当的安全和健康实践，并确定监管限制的适用性。

1.1 This test method describes a highly accurate technique for measuring the normal spectral emittance of electrically conducting materials or materials with electrically conducting substrates, in the temperature range from 600 to 1400 K, and at wavelengths from 1 to 35 μm. 1.2 The test method requires expensive equipment and rather elaborate precautions, but produces data that are accurate to within a few percent. It is suitable for research laboratories where the highest precision and accuracy are desired, but is not recommended for routine production or acceptance testing. However, because of its high accuracy this test method can be used as a referee method to be applied to production and acceptance testing in cases of dispute. 1.3 The values stated in SI units are to be regarded as the standard. The values in parentheses are for information only. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.