IEC TS 62607是一项技术规范，本部分规定了用于评估有机/纳米材料中大范围电荷载流子浓度的样品结构。本规范适用于金属/绝缘体/半导体堆叠结构中的电容电压（C-V）测量和范德堡配置的霍尔效应测量。本文还给出了选择有机半导体层中电荷载流子浓度测量方法的标准。购买本文件时可获得的所有当前修订均包含在购买本文件中。

This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.All current amendments available at time of purchase are included with the purchase of this document.