现行

ECA/EIA 700D000

SECTIONAL SPECIFICATION FOR DISCRETE CONTACTS OF CERTIFIED QUALITY
经认证质量的离散触点分规范

1998-01-01

现行

ECA/EIA 700BA00

BLANK DETAIL SPECIFICATION FOR RECTANGULAR/TRAPEZOIDAL CONNECTORS OF CERTIFIED QUALITY
经质量认证的矩形/梯形连接器空白详细规范

1998-09-01

现行

ECA/EIA 520AA00

BLANK DETAIL SPECIFICATION FOR SPECIAL-USE PUSHBUTTON SWITCHES OF CERTIFIED QUALITY
经认证质量的专用按钮开关空白详细规范

1988-04-01

现行

ECA/EIA 520FA00

BLANK DETAIL SPECIFICATION FOR SPECIAL USE ROTARY SWITCHES OF CERTIFIED QUALITY
经质量认证的特殊用途旋转开关空白详细规范

1997-11-06

现行

ECA/EIA 520CA00

BLANK DETAIL SPECIFICATION FOR SPECIAL-USE SENSITIVE SWITCHES OF CERTIFIED QUALITY
经认证质量的特殊用途敏感开关空白详细规范

1992-05-01

现行

ECA/EIA SP 3703

DETAIL SPECIFICATION FOR HIGH DENSITY TUNING FORK CONTACTS AND COMPONENTS OF CERTIFIED QUALITY
经认证质量的高密度音叉触点和部件详细规范

1999-07-19

现行

BS QC 750104-1991

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 开关用双极晶体管

1991-11-15

现行

BS QC 750112-1988

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
电子元件质量评定协调体系规范 空白详细规范 半导体器件 离散设备 场效应晶体管 5W和1GHz以下单栅场效应晶体管空白详细规范

1988-12-15

现行

BS QC 750103-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于低频放大的外壳额定双极晶体管

1990-02-15

现行

BS QC 750107-1991

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于高频放大的外壳额定双极晶体管

1991-11-15

现行

BS QC 750001-1986

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Signal diodes, switching diodes and controlled avalanche diodes
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 信号二极管、开关二极管和受控雪崩二极管

1986-11-15

现行

BS CECC 17001-1984

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Mercury wetted make contact units for general application
电子元件质量评定协调体系规范 空白详细规范 一般应用的湿汞接触单元

1984-08-15

现行

BS QC 750102-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于低频和高频放大的环境额定双极晶体管

1990-02-15

现行

BS QC 750106-1993

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 用于外壳额定功率放大器应用的场效应晶体管

1993-07-15

现行

BS QC 750111-1991

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 双向三极晶闸管（TRIAC） 环境或外壳额定 高达100 A

1992-01-31

现行

BS QC 750110-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 反向阻断三极晶闸管 环境和外壳额定 高达100 A

1990-02-15

现行

BS CECC 51001-1987

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: mercury wetted change-over contact units, magnetically biased
电子元件质量评定协调体系规范 空白详细规范:磁偏置汞湿转换触点

1987-01-15

现行

BS QC 750108-1990

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, up to 100 A
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 整流二极管（包括雪崩整流二极管） 环境和外壳额定 高达100 A

1990-02-15

现行

BS QC 750114-1996

Harmonized system of quality assessment for electronic components. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for case-rated field-effect transistors for switching applications
电子元件质量评定协调体系 半导体器件 离散设备 场效应晶体管 开关用外壳额定场效应晶体管空白详细规范

1996-12-15

现行

BS QC 750005-1987

Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes
电子元件质量评定协调体系规范 半导体分立器件 空白详细规范 电压调节器二极管和电压参考二极管 不包括温度补偿精密参考二极管

1987-09-15