本文件规定了一种低压试验方法，用于检测和定位波纹和/或波状型材的搪瓷涂层中出现的缺陷（气孔、裂纹或弹出），并延伸至金属基底。 该方法基于颜色效应（光学方法），适用于缺陷及其精确位置的精确检测。它可以用于非平坦、更异形的形状，如波纹或波状表面。 注:低压试验是一种无损试验，用于检测延伸至金属基底的缺陷，因此，与根据ISO 2746进行的高压试验相比完全不同。

This document specifies a low-voltage test method for detecting and locating defects (pores, cracks or pop-offs) that occur in enamel coatings of corrugated and/or undulated profiles and that extend down to the metal base. The method is based on colour effects (optical method) and is applicable to the precise detection of defects and their exact position. It can be used for non-flat, more profiled shapes such as corrugated or undulated surfaces. NOTE The low-voltage test is a non-destructive test for detecting defects extending down to the metal base and is, therefore, completely different in comparison to the high-voltage test in accordance with ISO 2746.