BS EN 62433-3:2017提供了一种推导宏观模型以进行模拟的方法 集成电路（IC）的辐射发射水平。这种模式通常被称为 集成电路发射模型？辐射发射，ICEM-RE。该模型旨在 用于对完整的IC进行建模，包括或不包括其相关的封装、功能组件 模块和模拟和数字IC（输入/输出）的知识产权（IP）模块 引脚、数字核心和电源），当测量或模拟数据无法直接导入时 进入模拟工具。交叉引用:FprEN 62433-2ANSI INCITS 4:1986IEC TS 62433-1:2011IEC 61967-1:2002EN 61967-1（IEC 61967-1:2002）ASIEC 62433-2:2017IEC TS 61967-3:2014EN 28879:1990ISO 8879:1986购买本文件时可提供的所有现行修改件均包含在购买本文件中。

BS EN 62433-3:2017 provides a method for deriving a macro-model to allow the simulation of the radiated emission levels of an Integrated Circuit (IC). This model is commonly called Integrated Circuit Emission Model?Radiated Emission, ICEM-RE. The model is intended to be used for modelling a complete IC, with or without its associated package, a functional block and an Intellectual Property (IP) block of both analogue and digital ICs (input/output pins, digital core and supply), when measured or simulated data cannot be directly imported into simulation tools.Cross References:FprEN 62433-2ANSI INCITS 4:1986IEC TS 62433-1:2011IEC 61967-1:2002EN 61967-1 (IEC 61967-1:2002) ASIEC 62433-2:2017IEC TS 61967-3:2014EN 28879:1990ISO 8879:1986All current amendments available at time of purchase are included with the purchase of this document.