IEC 62433-6:20 20描述了用于根据IEC 61000-4-2导出集成电路（IC）针对传导静电放电（ESD）和根据IEC 61000-4-4导出电快速瞬变（EFT）的抗扰度宏模型的提取流程。 该模型解决了由于过电压、热损伤和其他故障模式引起的物理损伤。也可以解决功能故障。该模型允许在应用中模拟IC的抗扰度。该模型通常被称为“集成电路免疫模型传导脉冲免疫”，ICIM-CPI。 本文件规定: -表示IC的电、热或逻辑行为的ICIM-CPI宏模型元件的描述。 -基于XML的通用数据交换格式。

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4.
The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI.
This document provides:
- the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC.
- a universal data exchange format based on XML.