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Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources 脉冲X射线源用剂量测定系统选择的标准指南
发布日期: 2024-05-01
1.1 本指南为在闪光X射线实验中选择和使用剂量测定系统提供了帮助。描述了剂量和剂量率技术。 1.2 给出了闪光X射线源的工作特性,重点介绍了输出光子的光谱。 1.3 提供帮助以将测量的剂量与被测器件(DUT)的响应相关联。该器件被假定为半导体电子部件或系统。 1.4 本国际标准是根据世界贸易组织技术性贸易壁垒委员会发布的《关于制定国际标准、指南和建议的原则的决定》中确立的国际公认的标准化原则制定的。 ====意义和用途====== 4.1 闪光X射线设施提供强烈的韧致辐射环境,通常在一个亚微秒的脉冲中,该脉冲的振幅、形状和光谱在不同的镜头之间波动。因此,必须对每次暴露进行适当的剂量测定,以确定环境特征,见ICRU报告34。这些强韧致辐射源具有多种应用,包括以下方面: 1. 研究X射线和伽马射线对材料的影响。 2. 研究辐射对晶体管、二极管和电容器等电子设备的影响。 3. 计算机代码验证研究。 4.2 本指南旨在帮助实验者选择脉冲X射线设备所需的剂量测定系统。本指南还简要介绍了如何使用每个剂量测定系统。其他指南(请参阅第节 2. )提供关于辐射环境中所选剂量测定系统的更详细信息,并应在对要使用的适当剂量测定系统做出初步决定后进行咨询。有许多关键参数描述闪光X射线源,例如剂量、剂量率、光谱、脉冲宽度等,使得通常没有单个剂量测定系统能够同时测量所有参数。 然而,通常情况下,并非所有关键参数都必须在给定的实验中进行测量。
1.1 This guide provides assistance in selecting and using dosimetry systems in flash X-ray experiments. Both dose and dose rate techniques are described. 1.2 Operating characteristics of flash X-ray sources are given, with emphasis on the spectrum of the photon output. 1.3 Assistance is provided to relate the measured dose to the response of a device under test (DUT). The device is assumed to be a semiconductor electronic part or system. 1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 4.1 Flash X-ray facilities provide intense bremsstrahlung radiation environments, usually in a single sub-microsecond pulse, which often fluctuates in amplitude, shape, and spectrum from shot to shot. Therefore, appropriate dosimetry must be fielded on every exposure to characterize the environment, see ICRU Report 34. These intense bremsstrahlung sources have a variety of applications which include the following: (1) Studies of the effects of X-rays and gamma rays on materials. (2) Studies of the effects of radiation on electronic devices such as transistors, diodes, and capacitors. (3) Computer code validation studies. 4.2 This guide is written to assist the experimenter in selecting the needed dosimetry systems for use at pulsed X-ray facilities. This guide also provides a brief summary on how to use each of the dosimetry systems. Other guides (see Section 2 ) provide more detailed information on selected dosimetry systems in radiation environments and should be consulted after an initial decision is made on the appropriate dosimetry system to use. There are many key parameters which describe a flash X-ray source, such as dose, dose rate, spectrum, pulse width, etc., such that typically no single dosimetry system can measure all the parameters simultaneously. However, it is frequently the case that not all key parameters must be measured in a given experiment.
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归口单位: E10.07
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